Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Double-source energy spectrum CT high-resolution imaging device and method

A high-resolution, imaging device technology, applied in radiological diagnostic image/data processing, medical science, diagnosis, etc., can solve the problems of image resolution and imaging dose without improvement, and achieve good density resolution and high spatial resolution Effect

Pending Publication Date: 2022-05-31
SUZHOU LINATECH MEDICAL SCI & TECH CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] There are currently three implementation schemes for spectral CT, including dual-source and dual-detector, fast voltage switching, and double-layer imaging panels. These schemes can realize the identification of substances and effectively remove image hardening artifacts. No improvement in imaging dose

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Double-source energy spectrum CT high-resolution imaging device and method
  • Double-source energy spectrum CT high-resolution imaging device and method
  • Double-source energy spectrum CT high-resolution imaging device and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] Preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0047] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0048] The use of ordinal numbers "first", "second", "third", etc. to describe ordinary objects merely means referring to different instances of similar objects and is not intended to imply that the objects so described necessarily have temporal, spatial, Sorting aspects or a given order in any other way.

[0049] In addition, an...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a double-source energy spectrum CT high-resolution imaging device and method.The double-source energy spectrum CT high-resolution imaging device is installed on a CT slip ring rotating support and comprises a high-energy imaging assembly and a low-energy imaging assembly; each of the high-energy imaging assembly and the low-energy imaging assembly comprises an X-ray emitting device for emitting X-rays, and an amorphous silicon detector and an amorphous selenium detector for collecting digital images. According to the invention, the amorphous silicon detector and the amorphous selenium detector are used, the amorphous silicon detector and the amorphous selenium detector are combined into a larger detector, the amorphous silicon detector and the amorphous selenium detector carry out imaging independently and reconstruct three-dimensional data, the spatial resolution of an image reconstructed by the amorphous selenium detector is higher, and the detection precision is higher. The density resolution of the image reconstructed by the amorphous silicon detector is higher, the two groups of images are fused after reconstruction is completed, and the fused image can keep higher spatial resolution and can also guarantee better density resolution.

Description

technical field [0001] The invention belongs to the technical field of radiotherapy, and in particular relates to a dual-source energy spectrum CT high-resolution imaging device and method. Background technique [0002] Dual-energy CT technology refers to the use of two X-ray sources with different energy spectral distributions to scan the object to be detected, to obtain the original data scanned under two different energy spectral distributions, and then use these data, through the corresponding image processing algorithm, Reconstruct the atomic number, electron density, attenuation coefficient and other information of the detected object. The advantage of dual-energy CT technology is that it can not only reconstruct the attenuation coefficient image of single-energy CT imaging, but also reconstruct the atomic number and electron density information of the substance at the same time. The error introduced when the atomic number is used as a reference value for identificati...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): A61B6/03
CPCA61B6/035A61B6/4266A61B6/52
Inventor 费旋珈姚毅
Owner SUZHOU LINATECH MEDICAL SCI & TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com