The invention discloses an X-
ray two-dimensional phase-
contrast imaging method of
single exposure. The method specifically includes following steps: during imaging, a detected object is arranged between a first encoding diaphragm M and an area array
detector and close to the first encoding diaphragm M, the change of the intensity and the direction of the X-
ray is caused by absorption and
refraction of the X-
ray by the detected object, the ray intensities I1, I2, I3 and I4 detected by pixels of the
detector are changed, quantified phase and absorption information can be extracted by employing relative changes thereof, and two-dimensional phase-
contrast imaging of the X-ray of
single exposure is realized. The beneficial effects of the method are that the acquisition process is simplified, original secondary
exposure is simplified as
single exposure, the imaging time and the
irradiation dose are reduced by 50% compared with that of the original method, the mode of single
exposure can realize dynamic and online phase-
contrast imaging, the realization of the phase-contrast
CT technology of the X-ray is facilitated, two-dimensional phase-contrast imaging can be realized, and the object detail distinguishing capability and the defect detection capability are improved.