Check patentability & draft patents in minutes with Patsnap Eureka AI!

Method and apparatus for retaining a spring probe

A technology of spring probe and spring force, which is applied to parts, instruments, and measuring devices of electrical measuring instruments, and can solve problems such as replacing a damaged one, difficulty in grounding spring probes, and difficulty in spring probes

Inactive Publication Date: 2006-12-06
3M INNOVATIVE PROPERTIES CO
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But making pogo probes with banana bends is difficult and expensive, requiring different types of pogo probes for signal and ground wires
Obviously, this increases the difficulty and cost of manufacturing, while increasing inventory, which is not ideal
In either case, it is very difficult to replace a damaged ground spring probe without damaging other components of the assembly

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and apparatus for retaining a spring probe
  • Method and apparatus for retaining a spring probe
  • Method and apparatus for retaining a spring probe

Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach

[0046] Figure 7A An alternate embodiment of a spring probe block assembly 150 is shown in . The spring probe block assembly 150 includes an insulating housing 152 , signal probe contacts 161 and ground probe contacts 158 , and a probe connector holder 156 . As with the first embodiment, housing 152 is molded from a dielectric material that surrounds the ground element and associated signal lines and isolates it from all other signal lines and ground pairs, and also All grounds in this assembly are isolated from other adjacent probe block assemblies and ATE chassis grounds. As noted above, the cored cavities in both ends of housing 152 conform to the overall envelope of an assembled set of grounding elements and are sized to constrain the assembled ground element when spring probes are installed therein. Axial and lateral movement of the probe connector and ground clip.

[0047] Such as Figure 7A7B , the probe holder 156 includes a pair of stamped electrical ground clips ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A spring probe block assembly includes an insulative housing. A probe connector having a signal probe, an insulative layer, and a conductive shell is positioned within the housing. At least one ground probe is also positioned within the housing. The ground probe and the conductive shell of the probe connector are electrically connected by a grounding element. The grounding element is configured to elastically deform the ground probe in such a manner as to create spring energy in the ground probe. The spring energy generates a normal force between the ground probe and the grounding element which maintains the ground probe in its position. Also, a method for retaining a spring probe in a housing by elastically deforming the spring probe to maintain a spring force between the spring probe and the housing.

Description

technical field [0001] The present invention relates to a spring probe block assembly for use in automatic test equipment (ATE), and more particularly to a spring probe block assembly for high bandwidth applications. Background technique [0002] The spring probe block is used to provide a temporary elastic contact interface between an integrated circuit or other electronic device and an automatic test equipment test head for necessary testing of the integrated circuit or other electronic device. Spring probe block assemblies for use in automatic test equipment are readily available and often of a similar design. Spring probe block housings are typically machined from metal bar stock in an expensive process that ensures the precise location and diameter of the holes to accept the press-fit coaxial probe and ground socket. Solid metal fabrication is also used to ground all circuit elements to a common ground, which until now was considered ideal in terms of signal integrity....

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/067G01R1/073G01R31/28
CPCG01R1/06716G01R1/07357G01R1/07314G01R1/06722G01R1/067
Inventor 史蒂文·费尔德曼
Owner 3M INNOVATIVE PROPERTIES CO
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com