Unlock instant, AI-driven research and patent intelligence for your innovation.

Method and apparatus for setting the slice level in a binary signal

A technology of binary signal and signal level, which is applied in the direction of DC level change, shaping network in transmitter/receiver, DC level restoration device/bias distortion correction, etc.

Inactive Publication Date: 2007-06-06
卡莱汉系乐有限公司
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in many applications the noise is distributed asymmetrically, with noise peaks in one signal level (on average) having different magnitudes than noise peaks in another signal level

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and apparatus for setting the slice level in a binary signal
  • Method and apparatus for setting the slice level in a binary signal
  • Method and apparatus for setting the slice level in a binary signal

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] The binary signal T shown in Figure 1 has two signal levels, one representing logic "1" and the other representing logic "0". The two signal levels are destroyed to similar extent by noise. When receiving this signal, it is necessary to determine which signal level is being sent. Therefore, the threshold or limit level SL is set to approximately half between the average positive signal level and the average negative signal level, as shown in Figure 1. The logical value "1" (or signal level "high") is assigned to those signal parts that exceed the limit level SL, and the logical value "0" (or signal level "low") is assigned to the remaining signal parts. The dotted line shows the obtained waveform, which is called the detected signal.

[0023] Set the limit level to half between the average positive signal level and the average negative signal level (corresponding to the signal level "ground" in Figure 1), so that the noise peak (detected) caused by the noise peak over the l...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method of setting the slice level (SL) in a binary signal (T) comprises measuring the noise level at both signal levels (A,B) and adjusting (Z) the slice levels in dependence upon the measured noise levels. By weighing the noise levels, asymmetric noise is taken into account. A device (10) for setting the slice level comprises level shift means and noise peak level detection means.

Description

Technical field [0001] The invention relates to a method and device for setting a limit level in a binary signal. Background technique [0002] The two signal levels of the binary signal usually refer to the "high" and "low" levels, which are logic "1" and logic "0" respectively. The "high" level corresponds to a signal level of, for example, +5V, and the "low" level corresponds to a signal level of, for example, -5V or ground. When recovering the transmitted binary signal, it is necessary to determine which part of the signal is high and which is low. Therefore, the threshold is usually set approximately in the middle of the high signal level and the low signal level. Any signal level that exceeds the threshold or "limit level" is considered high, and other signal levels are classified as low. [0003] In the presence of noise, errors may be introduced. The noise peaks present in the low-level signal part will exceed the limit level, causing the high level to be detected incorre...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H03K5/08H04L25/06H03K5/007H03K5/1532H04L25/03H04N7/035
CPCH03K5/086H04L25/063H04N7/0355
Inventor R·J·海纳
Owner 卡莱汉系乐有限公司