Cleaning solution for removing residue
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- TOKUYAMA CORP
- Publication Date
- 2003-01-29
- Estimated Expiration
- Not applicable Β· inactive patent
Abstract
Description
technical field
[0001] The present invention relates to a residue cleaning solution aimed at cleaning residues generated during ashing, etching, or CMP processing of substrates during the manufacture of electronic circuit patterns. Background technique
[0002] ICs, LSIs, or LCDs on semiconductor wafers are generally manufactured by forming fine electronic circuit patterns on substrates using photolithography technology. Specifically, a photoresist is coated on a substrate wafer formed with an insulating film such as silicon oxide and a wiring layer such as Al, Cu, Si, Ti, or a low-dielectric film composed of SOG and fluorine-based resins. , Exposure and development are performed through a mask on which a desired pattern is formed, and a resist pattern is formed on a desired portion. Then, the insulating film, the wiring layer, or the low-dielectric film are etched from the resist pattern, and then the resist is removed. In the formation of such electronic circuit patterns...