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Method and apparatus for x-ray diffraction analysis

一种X射线、装置对的技术，应用在用于X射线衍射分析和装置领域，达到节省时间、改进粒子统计学的效果

Active Publication Date: 2006-11-08
F HOFFMANN LA ROCHE & CO AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This creates problems during comparison of diffractograms for identification

Method used

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  • Method and apparatus for x-ray diffraction analysis
  • Method and apparatus for x-ray diffraction analysis
  • Method and apparatus for x-ray diffraction analysis

Examples

Experimental program
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example 1

[0087] Example 1: First embodiment of the method according to the invention

[0088] A first embodiment of the method according to the invention for the transmission mode X-ray diffraction analysis of a single sample is described below with reference to the accompanying drawings 1 to 5 .

[0089] FIG. 1 shows a schematic perspective view of a sample container 11 and a ribbon-shaped X-ray beam 24, such as a single well or a well in the multiwell tray 12 shown in FIG. The sample on the base, such as the bottom wall of the sample container 11. In the context of the present invention, the term "ribbon-shaped X-ray beam" means that the beam extends along a flat, ribbon-shaped irradiation area and that the cross-section of the beam is approximately rectangular.

[0090] The mutually orthogonal coordinate axes X, Y, Z are shown in FIG. 1 for reference.

[0091] The region irradiated by the X-ray beam is the volume through which the X-ray beam extends. If the X-ray beam has approxi...

no. 1 example

[0098] A first embodiment of the method according to the invention comprises the following steps:

[0099] (A1) placing the sample to be analyzed on a flat base 19 suitable for receiving and holding the sample and transparent to X-ray radiation;

[0100] (B1) using an X-ray radiation source 21 (not shown in FIGS. 1-5 ) to generate a ribbon-shaped X-ray beam 24, as shown in FIGS. 1, 2, 4 and 5, the central portion of the beam 24 extending along a plane;

[0101] (C1) positioning the base 19 and thus the sample placed on the base in the initial position shown in FIG. , the beam 24 irradiates a slice 27 of a volume element 13 containing the sample ( image 3 shown), thereby illuminating the thin slice of the sample itself;

[0102] (D1) Make the base 19 perform the following movements relative to the above-mentioned initial position:

[0103] (D1.1) rotating the base 19 and thus the sample about the axis of rotation 29, and

[0104] (D1.2) inclining the substrate 19 and thus t...

example 2

[0130] Example 2: First embodiment of the device according to the invention

[0131] Image 6 A schematic cross-sectional view showing the structure of a first embodiment of an apparatus for performing the method described above. Image 6 The section shown is taken along a plane parallel to the plane YZ of FIG. 1 and passing through the center of the base member 19 . Image 6 The shown arrangement comprises an X-ray radiation source 21 providing an X-ray beam 24 for illuminating a sample placed on a substrate 19 and a detector 22 for detecting the X-rays transmitted through and detected by the sample. Diffraction of X-ray radiation 26 . Image 6 Diffraction angle 2θ is shown. θ is the Bragg angle.

[0132] Image 6 The device shown in is a diffractometer comprising an X-ray radiation source 21 adapted to provide a ribbon-shaped X-ray beam 24, the central portion of which extends along a plane as shown in Figures 1, 2, 4 and 5 .

[0133] Image 6 The devices schematical...

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PUM

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Abstract

A method for transmission mode X-ray diffraction analysis of a sample by means of an apparatus comprising a X-ray radiation source that provides X-ray radiation for irradiating the sample and a detector for detecting X-ray radiation transmitted through and diffracted by the sample. The method comprises: (a) placing a sample to be analyzed on a substrate, (b) generating a strip-shaped X-ray beam the central part of which extends along a plane, (c) positioning the substrate and thereby the sample in an initial position in which said sample lies in the path of beam and a slice of the sample is irradiated by beam, (d) effecting the following movements of the substrate with respect to the above mentioned initial position thereof: (d.1) a rotation of the substrate and thereby of the sample around a rotation axis which is perpendicular to the substrate, the rotation covering a predetermined rotation angle, and (d.2) a tilting of the substrate and thereby of the sample around a tilting axis and over a tilting angle (T) defined as the angle that the rotation axis forms with the plane through which the central part of the beam extends, the tilting axis lying in the plane through which the central part of the beam extends and being perpendicular to the rotation axis, the tilting covering a tilting angle (T) comprised between a first and a second predetermined value, and (e) detecting with the detector X-ray radiation transmitted through and diffracted by the sample during a time interval over which the above mentioned movements of the substrate are effected.

Description

technical field [0001] The invention relates to a method for the transmission mode X-ray diffraction analysis of a sample using a device comprising an X-ray radiation source providing X-ray radiation for irradiating said sample and a detector with for detecting X-ray radiation transmitted through and diffracted by the sample. [0002] The invention also relates to a device for the transmission mode X-ray diffraction analysis of a sample, said device comprising a source of X-ray radiation providing X-ray radiation for irradiating said sample, and a detector with for detecting X-ray radiation transmitted through and diffracted by the sample. [0003] The invention also relates to a method for transmission mode X-ray diffraction analysis of a plurality of samples using an apparatus comprising a source of X-ray radiation and a detector for detecting X-ray radiation transmitted through and diffracted by the sample . [0004] The invention also relates to an apparatus for transmi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/207G01N23/20
CPCG01N23/20
Inventor O·格拉斯曼M·亨尼格R·A·霍彻特拉瑟尔U·施维特
Owner F HOFFMANN LA ROCHE & CO AG