Method and system for testing chip

Abstract

This invention discloses one test chip method, which comprises the following steps: a, setting programmable logic unit with analogue sensor output signals; b, programmable logic unit receiving input data and analogue output signal of sensor and the unit inputs the signals to the chip tested; c, receiving input data by use of output signal for data process. This invention compares the results of chips and software evaluation tool and also compares the chip and input data to observe chip computation formula effect.

Description

technical field

[0001] The invention relates to a test technology, in particular to a method and system for testing a chip. Background technique

[0002] In the process of chip development and manufacturing, the process of testing the chip must be carried out. As shown in Figure 1, it is a schematic diagram of the composition and structure of the system that needs to be built for the prior art test chip, which includes:

[0003] Sensor 102: used to collect input data that needs to be processed and output the output as the input of the chip to be tested.

[0004] The chip under test 101 is used to process the output of the sensor 102 and send the processing result to the display 103 . Different chips have different processing functions. For example, the image processing chip in the multimedia processing chip has the functions of image gain control, image format conversion, image scaling, color adjustment and gamma correction; the sound processing chip has the function of so...

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