Coaxial probe

a probe and coaxial technology, applied in the field of coaxial probes, can solve the problems of low structural strength, easy loosening of the center conductive probe, and inability to assemble correspondingly, and achieve the effect of avoiding the damage of the probe caused by the impact for

Inactive Publication Date: 2014-01-30
CHIN NAN PRECISION ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0007]Thereby the probe of the coaxial probe according to the present invention is hidden in the protective sleeve. After the protective sleeve being in contact with a coaxial connector to be detected, the probe continues to move and project from the protective sleeve for detecting the coaxial connector. Thus the fragile probe will not be affected by the impact force directly and damages of the probe caused by the impact force can be avoided.

Problems solved by technology

During the assembly of two coaxial terminals, they may be not assembled correspondingly or easy get loose after being connected due to size errors or insufficient mating / unmating force, etc.
The center conductive probe is as fine as a needle and is of low structural strength.
This leads to imprecision of next probing cycle.

Method used

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Examples

Experimental program
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Embodiment Construction

[0015]Refer from FIG. 1 to FIG. 3, a coaxial probe of the present invention mainly includes an assembly base 1, a main sleeve 2, a protective sleeve 3 a probe portion 4.

[0016]The assembly base 1 is disposed with a threaded segment 11 on an outer wall thereof and a through hole 13 on a center thereof. A connection disc 12 with a plurality of fastening holes 121 is arranged at the assembly base 1, under the threaded segment 11.

[0017]The main sleeve 2 is disposed under the assembly base 1 and a top end of the main sleeve 2 is mounted into the through hole 13 of the assembly base 1. A sleeve port 21 is arranged at a center of the main sleeve 2. A connection member 22 is mounted in the sleeve port 21 of the main sleeve 2 and the through hole 13 of the assembly base 1. An insertion hole 221 is located on a center of the connection member 22 and a plunger rod 222 is mounted in the insertion hole 221 of the connection member 22. A connection segment 223 is formed between the bottom edge of ...

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PUM

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Abstract

A coaxial probe is revealed. A protective sleeve is mounted in a sleeve port of a main sleeve. A leaning flange projecting inward is formed on a bottom end of a sleeve port of the main sleeve. The leaning flange is stopped and positioned by a stopping flange on an upper part of the protective sleeve. A probe is disposed on a sleeve port of the main sleeve and is passed through a sleeve port of a protective hole. Thus the probe is hidden in the protective sleeve. After the protective sleeve being in contact with a coaxial connector to be detected, the probe is moved to project from the protective sleeve for detecting the coaxial connector. Thereby damages of the probe caused by impact force received can be avoided.

Description

BACKGROUND OF THE INVENTION[0001]1. Field of the Invention[0002]The present invention relates to a coaxial probe, especially to a coaxial probe that effectively prevents a probe thereof from being damaged due to impact force received.[0003]2. Description of Related Art[0004]The design of coaxial terminals provides great convenience in assembly of two electronic devices. During the assembly of two coaxial terminals, they may be not assembled correspondingly or easy get loose after being connected due to size errors or insufficient mating / unmating force, etc. Refer to Taiwanese Pat. Pub. No. 1291269 coaxial connector and measuring coaxial probe, a coaxial probe is disclosed. However, a center conductive probe of the coaxial probe revealed in the Taiwanese Pat. Pub. No. 1291269 is projecting from the housing and exposed outside. When the coaxial probe is moved downward to be inserted into a socket thereunder correspondingly, the center conductive probe exposed outside the housing is fi...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H01R9/05
CPCG01R1/06722H01R13/2421H01R13/4538H01R24/52H01R2103/00H01R2201/20
Inventor CHEN, WEN-FENG
Owner CHIN NAN PRECISION ELECTRONICS
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