Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Deep insulating trench

a deep-insulating trench and trench technology, applied in the direction of basic electric elements, electrical apparatus, semiconductor devices, etc., can solve the problems of low and achieve the effect of minimizing the isolation capacity of the deep-insulating trench and without introducing any risk of substrate dislocation

Inactive Publication Date: 2006-05-02
STMICROELECTRONICS SRL +1
View PDF1 Cites 54 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0010]In view of the foregoing background, an object of the present invention is to provide a different system in which the isolating capacity of a deep isolating trench is minimized, and without introducing any risk of dislocation of the substrate.
[0013]The risks of dislocation in the substrate are low, due to the presence of the empty cavity and the small volume of the electrically insulating material that only coats the sides and the bottom of the deep trench. The layer of electrically insulating material that delimits the empty cavity has a relative elasticity, which a solid block does not have.

Problems solved by technology

The risks of dislocation in the substrate are low, due to the presence of the empty cavity and the small volume of the electrically insulating material that only coats the sides and the bottom of the deep trench.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Deep insulating trench
  • Deep insulating trench
  • Deep insulating trench

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030]FIGS. 1A to 1C illustrate examples of deep trenches according to the invention. An integrated circuit with a substrate 1 made of a semiconductor material of a type in which a deep isolating trench has been formed is shown diagrammatically.

[0031]The deep isolating trench comprises a bottom 10, sides 11 and an opening 9. According to the invention, the bottom 10 and the sides 11 formed in the semiconductor material are covered by an electrically insulating material 12 that delimits an empty cavity 13 closed at the bottom by a plug 14. The sides 11 comprise a neck 15 that defines the position of the plug 14, and a first portion 16 that tapers outwards from the neck 15 towards the opening 9 as the distance from the bottom 10 increases. The slope of this first portion 16 is said to be positive.

[0032]The greatest width of the first portion 16 may be equal to about twice the width of the neck 15. An empty cavity 13 means a cavity that does not contain any solid material. The empty pa...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Deep isolation trenches having sides and a bottom are formed in a semiconductor substrate. The sides and the bottom are coated with an electrically insulating material that delimits an empty cavity, and forms a plug to close the cavity. The sides of the trench are configured with a neck that determines the depth of the plug, and a first portion that tapers outwards from the neck as the distance from the bottom increases. Deep isolation trenches may be applied, in particular, to bipole and BiCMOS circuits.

Description

[0001]This application is a 371 of PCT / FR02 / 02029 Jun. 13, 2002.FIELD OF THE INVENTION[0002]The present invention relates to the manufacture of integrated circuits, and more particularly, to circuits using bipole or BiCMOS technologies.BACKGROUND OF THE INVENTION[0003]Deep isolating trenches formed in a substrate are intended to isolate the different elements of the circuit from each other, and to minimize parasitic components that exist between the structures. These deep isolating trenches are known as DTI (Deep Trench Isolation). Deep means that the depth of the trenches is greater than their width, and is much greater than the depth of the buried layers in the substrate. These deep trenches are used to separate the N+ and P+ buried layers, and thus reduce the perimeter component of the collector / substrate capacitance. These capacitances contribute to the calculation of circuit noise and to the oscillation frequency of bipole transistors.[0004]Deep isolating trenches surround bipo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(United States)
IPC IPC(8): H01L29/00H01L21/3065H01L21/316H01L21/76H01L21/762H01L21/764
CPCH01L21/764H01L21/76232H01L21/31612H01L21/76237H01L21/02129H01L21/02164H01L21/02274
Inventor MARTY, MICHELFORTUIN, ARNOUDARNAL, VINCENT
Owner STMICROELECTRONICS SRL
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products