216 results about "BiCMOS" patented technology

In a bipolar transistor block, a base layer (20a) of SiGe single crystals and an emitter layer (26) of almost 100% of Si single crystals are stacked in this order over a collector diffused layer (9). Over both edges of the base layer (20a), a base undercoat insulating film (5a) and base extended electrodes (22) made of polysilicon are provided. The base layer (20a) has a peripheral portion with a thickness equal to that of the base undercoat insulating film (5a) and a center portion thicker than the peripheral portion. The base undercoat insulating film (5a) and gate insulating films (5b and 5c) for a CMOS block are made of the same oxide film. A stress resulting from a difference in thermal expansion coefficient between the SiGe layer as the base layer and the base undercoat insulating film 5a can be reduced, and a highly reliable BiCMOS device is realized.

A circuit for protecting a circuit device against electrostatic discharge (ESD), power line, and voltage supply line surges. A transistor, diode, resistor, and capacitor are configured to clamp voltage pulses between the power and ground lines. The circuit is constructed using a single bipolar npn transistor formed using an isolated p-well.

Nanotube-based logic circuitry is disclosed. Tri-stating elements add an enable/disable function to the circuitry. The tri-stating elements may be provided by nanotube-based switching devices. In the disabled state, the outputs present a high impedance, i.e., are tri-stated, which state allows interconnection to a common bus or other shared communication lines. In embodiments wherein the components are non-volatile, the inverter state and the control state are maintained in the absence of power. Such an inverter may be used in conjunction with and in the absence of diodes, resistors and transistors or as part of or as a replacement to CMOS, biCMOS, bipolar and other transistor level technologies.

Provided is a method for manufacturing a self-aligned BiCMOS including a SiGe heterojunction bipolar transistor (HBT) for performing high-frequency operations. In this method, an extrinsic base and a selective ion-implanted collector (SIC) are formed by a self-alignment process.

A method for forming deep trench or via airgaps in a semiconductor substrate is disclosed comprising the steps of patterning a hole in the substrate, partly fill said hole with a sacrificial material (e.g. poly-Si), depositing spacers on the sidewalls of the unfilled part of the hole (e.g. TEOS) to narrow the opening, removing through said narrowed opening the remaining part of the sacrificial material (e.g. by isotropic etching) and finally sealing the opening of the airgap by depositing a conformal layer (TEOS) above the spacers. The method of forming an airgap is demonstrated successfully for use as deep trench isolation structures in BiCMOS devices.

The thermoelectric detector comprises an infrared absorber pixel structure supported by two electrically connected beams made of a thermoelectric material. One end of the thermoelectric beam connects to the infrared absorber pixel structure; the other end connects to the substrate. The detector comprises a microlens for collecting and focusing infrared radiation on the detector. Infrared radiation is incident on the infrared absorber pixel structure results in a temperature gradient along the length of the thermoelectric legs, and generating an electrical voltage proportional to the gradient. A low noise SIGe BiCMOS readout integrated circuit is coupled to the detector to provide a background limited detector having improved detectivity.

An LDPMOS structure having enhanced breakdown voltage and specific on-resistance is described, as is a method for fabricating the structure. A P-field implanted layer formed in a drift region of the structure and surrounding a lightly doped drain region effectively increases breakdown voltage while maintaining a relatively low specific on-resistance.

Analog iterative decoders are provided that are based on the so-called min-sum algorithm (also referred to as max-sum or max-product, Max-Log-MAP or BP-based decoding) and can be used to decode powerful coding schemes such as low-density parity-check (LDPC) codes and turbo codes. The circuits can be implemented by standard CMOS technology, which means lower fabrication cost and/or simpler design compared to previously reported analog iterative decoders that are based on BiCMOS or sub-threshold CMOS technology. Soft information is passed among variable nodes and parity-check nodes. A low-voltage high-swing Max WTA circuit is also provided. The circuit can be implemented by short channel MOSFET transistors and yet provide a reasonably high degree of accuracy. Applications include soft computing, and analog signal processing, in general. A Min WTA circuit can also be built based on this circuit by subtracting the input currents from a large reference current.

The invention relates to a SiGe bipolar complementary metal oxide semiconductor (BiCMOS) radio-frequency power amplifier. The amplifier comprises a first-stage pre-amplification transistor, a second-stage power amplification transistor, a first-stage biasing circuit, a second-stage biasing circuit, an input matching network and an impedance conversion network. The circuit structure of the invention consists of a first-stage pre-amplification circuit and a second-stage power amplification circuit which are connected with each other through a coupling capacitor. The first-stage pre-amplification transistor is a standard SiGe transistor, and the linearity of the circuit is enhanced by a remote control (RC) serial feedback circuit; and the second-stage power amplification transistor is a high-voltage SiGe transistor and can reach relatively high output power. Both the first biasing circuit and the second biasing circuit have bipolar transistor current mirror structures, and temperature stability is enhanced by temperature negative feedback technology. The amplifier has high linearity and relatively high output power.

ESD (Electrostatic Discharge) robust current mirror circuits incorporate circuitry for decoupling the gate when the chip is unpowered. Additional protection is provided by a second element which provides de-biasing to prevent Vgs from being established. A third element can be added between the gate and the ground potential on the current mirror gate node to prevent the gate of the current mirror from rising too high and allows the current to be discharged through the element instead of the current mirror.

Junction field effect transistors (JFETs) can be fabricated with an epitaxial layer that forms a sufficiently thick channel region to enable the JFET for use in high voltage applications (e.g., having a breakdown voltage greater than about 20V). Additionally or alternatively, threshold voltage (VT) implants can be introduced at one or more of the gate, source and drain regions to improve noise performance of the JFET. Additionally, fabrication of such a JFET can be facilitated forming the entire JFET structure concurrently with a CMOS fabrication process and/or with a BiCMOS fabrication process.

The invention relates to a silicon controlled rectifier (SCR) electro-static discharge (ESD) protective circuit structure triggered by a diode, which belongs to the technical field of the electron. The invention converts a trigger voltage of a conventional SCR ESD protective circuit structure into a N+/P-well (or N-well/P+) junction breakdown voltage from a P-well/N-well junction breakdown voltage by integrating the diode with lower breakdown voltage so as to reduce the trigger voltage of the SCR ESD protective circuit structure and finally play a role of well protecting an internal circuit of a chip. Meanwhile, under the premise of not changing the trigger voltage, the silicon controlled rectifier (SCR) electro-static discharge (ESD) protective circuit structure can obtain an adjustable device maintaining voltage by simply adjusting size parameters of devices. The invention is compatible with a CMOS process, also can adopt processes of BiCMOS, BCD, SOI and the like, can connect the protective circuit structure provided by the invention between a power of an integrated circuit and the ground to serve as the ESD protection of a Power Clamp and also can connect the protective circuit structure among an input port and an output port of the integrated circuit and the power (the ground) to serve as the ESD protection of the input port and the output port.

A bipolar transistor structure is described incorporating an emitter, base, and collector having a fully depleted region on an insulator of a Silicon-On-Insulator (SOI) substrate without the need for a highly doped subcollector to permit the fabrication of vertical bipolar transistors on semiconductor material having a thickness of 300 nm or less and to permit the fabrication of SOI BiCMOS. The invention overcomes the problem of requiring a thick semiconductor layer in SOI to fabricate vertical bipolar transistors with low collector resistance.

Fashioning a quasi-vertical gated NPN-PNP (QVGNP) electrostatic discharge (ESD) protection device is disclosed. The QVGNP ESD protection device has a well having one conductivity type formed adjacent to a deep well having another conductivity type. The device has a desired holding voltage and a substantially homogenous current flow, and is thus highly robust. The device can be fashioned in a cost effective manner by being formed during a BiCMOS or Smart Power fabrication process.

According to an exemplary embodiment, a structure includes a silicon-on-insulator substrate including a buried oxide layer situated over a bulk silicon substrate and a silicon layer situated over the buried oxide layer. The structure further includes a trench formed in the silicon layer and the buried oxide layer, where the trench has a bottom surface and a first and a second sidewall, and where the trench is situated adjacent to an optical region of the silicon-on-insulator substrate. According to this exemplary embodiment, the structure further includes an epitaxial layer situated in the trench and situated on the bulk silicon substrate, where the epitaxial layer and the bulk silicon substrate form a bulk silicon electronic region of the silicon-on-insulator substrate. The structure further includes a base of a bipolar transistor situated on the epitaxial layer, where the base can be silicon-germanium.

An N type buried layer is buried in a P type silicon substrate. An N type epitaxial layer is formed on this buried layer. A P type intrinsic base region and an extrinsic base region are formed on the surface of the epitaxial layer. An N type emitter region is formed in the intrinsic base region. An emitter electrode is formed to contact the emitter region. A collector plug region is formed in an area separated from the extrinsic base region through a filed insulating film. A cobalt silicide film is formed on the extrinsic base region to surround the emitter electrode. An extrinsic base contact hole is formed at only one side of the emitter electrode. In the semiconductor device, the base resistance Rb and the collector-base capacity Ccb are reduced to make the maximum oscillation frequency fmax sufficiently large.

A stacked Poly-Poly/MOS capacitor useful as a component in a BiCMOS device comprising a semiconductor substrate having a region of a first conductivity-type formed in a surface thereof; a gate oxide formed on said semiconductor substrate overlaying said region of first conductivity-type; a first polysilicon layer formed on at least said gate oxide layer, said first polysilicon layer being doped with an N or P-type dopant; a dielectric layer formed on said first polysilicon layer; and a second polysilicon layer formed on said dielectric layer, said second polysilicon layer being doped with the same or different dopant as the first polysilicon layer.

The present invention provides a “subcollector-less” silicon-on-insulator (SOI) bipolar junction transistor (BJT) that has no impurity-doped subcollector. Instead, the inventive vertical SOI BJT uses a back gate-induced, majority carrier accumulation layer as the subcollector when it operates. The SOI substrate is biased such that the accumulation layer is formed at the bottom of the first semiconductor layer. The advantage of such a device is its CMOS-like process. Therefore, the integration scheme can be simplified and the manufacturing cost can be significantly reduced. The present invention also provides a method of fabricating BJTs on selected areas of a very thin BOX using a conventional SOI starting wafer with a thick BOX. The reduced BOX thickness underneath the bipolar devices allows for a significantly reduced substrate bias compatible with the CMOS to be applied while maintaining the advantages of a thick BOX underneath the CMOS. A back-gated CMOS device is also provided.