Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Optical fiber interference type on-line micro-displacement measuring system using fibre grating

A fiber grating and measurement system technology, applied in the field of optical measurement, can solve problems such as restricting applications, and achieve the effect of cost reduction and automatic measurement

Inactive Publication Date: 2008-12-03
BEIJING JIAOTONG UNIV
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Under laboratory conditions, the discharge frequency of piezoelectric ceramics is about 0.2Hz, which will limit the practical application of this technology.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Optical fiber interference type on-line micro-displacement measuring system using fibre grating
  • Optical fiber interference type on-line micro-displacement measuring system using fibre grating
  • Optical fiber interference type on-line micro-displacement measuring system using fibre grating

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0023] Such as image 3 As shown, the light emitted by the semiconductor laser LD with a spectral width of 1.5nm and a central wavelength of 1550nm is divided into two paths after passing through the single-mode fiber 3dB-coupler 1, gyrator 1 and 3dB-coupler 2, and then reaches the fiber grating FBG1 and The parameters of FBG2, FBG1 and FBG2 are the same, and the Bragg wavelengths they reflect are also the same, and they will reflect back light with a spectral width of 0.1nm and a center wavelength of 1549nm. The light of the remaining spectrum will pass through FBG1 and FBG2, and after being collimated by the self-collimating lens (GRIN), it will become a parallel beam, reach the measuring mirror and the reference mirror respectively, and then be reflected by the measuring mirror and the reference mirror, and re-enter the In the interferomete...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a micro-displacement measuring system, especially the micro-displacement measuring system applied for the online measurement. It uses the fiber grating nature and WDM technology to compose Michelson interferometer, and the interferometer contains two fibers Michelson interferometers with separate mirrors but almost overlap optical road. One interferometer is used for measurement, while another interferometer through feedback control to compensate the measurement impact for the environmental interference, thereby allowing the system to apply to on-line measurement. The invention only using the light emitted by a semiconductor laser with 1.5nm spectrum wide and 1550nm center wavelength to function the two interferometers at the same time, it not only lowers the system cost, but also conveniently implements the automatic measurement, and the feedback control circuit has no effect to the measurement with piezoelectric ceramic discharge, making the measurement continuously processing.

Description

technical field [0001] The invention relates to a micro-displacement measurement system, in particular to a micro-displacement measurement system suitable for on-line measurement, and belongs to the technical field of optical measurement. Background technique [0002] Existing report documents that are close to the technology of the present invention have the following two: [1] Dejiao Lin, XiangQian jiang, Fang Xie, Wei Zhang, Lin Zhang, and Ian Bennion, "High stability multiplexed fiber interferometer and its application on absolute displacement measurement and on-line surface metrology", Optics Express, Vol.12, Issue 23, 2004, P.5729-5734. (Optics Express, 2004, Volume 12, Issue 23, P.5729-5734)[2] Xiangqian Jiang, Dejiao Lin, Liam Blunt, Wei Zhang and Lin Zhang, "Investigation of some critical aspects of on-line surface measurement by wavelength-division-multiplexing technique", Measurement Science and Technology, Vol.17, No.3, 2006 , P.483-487. (Measurement Science and ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/02G01B9/02G01D5/353
Inventor 谢芳芦毅
Owner BEIJING JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com