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Leveling compensating mechanism in photoelectric measurement instrument

A photoelectric measurement and compensation device technology, applied in the direction of measuring devices, instrument parts, instruments, etc., can solve the problem of incomplete measurement results, etc., and achieve the effect of short leveling process time and high measurement efficiency

Inactive Publication Date: 2009-02-25
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

There are also certain human factors in the leveling process, so that the measurement results of the same thing by different people may not be exactly the same

Method used

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  • Leveling compensating mechanism in photoelectric measurement instrument
  • Leveling compensating mechanism in photoelectric measurement instrument
  • Leveling compensating mechanism in photoelectric measurement instrument

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Embodiment Construction

[0023] Such as figure 1 As shown, the leveling compensation device in the photoelectric measuring instrument of the present invention comprises: microprocessor 3, horizontal inclinometer 2; , its serial port is connected with the serial port of the microprocessor 3 through the RS232 interface, and the microprocessor 3 calculates the main point between the measured target and the optical system according to the tilt angle value output by the horizontal inclinometer 2, the height of the measured target and the imaging height of the measured target the distance between.

[0024] Such as figure 2 Shown, the internal procedure of described microprocessor 3 comprises the following steps:

[0025] initialization;

[0026] Read the data output by the horizontal inclinometer;

[0027] Calculate the imaging height of the measured target;

[0028] Calculate the distance between the measured target and the principal point of the optical system according to the tilt angle value outpu...

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Abstract

The invention relates to a leveling-compensating device of an optoelectronic measuring instrument, the device comprises a microprocessor and a level inclinometer; the level inclinometer is arranged on a datum plane of the optoelectronic measuring instrument, a serial port is connected with a serial port of the microprocessor, the distance between a measured object and the optical system principle point is calculated out by the microprocessor according to the inclination angle value output by the level inclinometer, and the measured object height and measured object imaging height. When the datum plane of the optoelectronic measuring instrument inclines within a certain inclination range, the invention compensates the measuring result in real time according to the inclination angle value, thus acquiring accurate measuring value with declining position, and the optoelectronic measuring instrument can be operated without precisely leveling and the leveling procedure is very short, during the measuring process, no operation is needed to keep the datum plane of the optoelectronic measuring instrument at the initial leveling status, the measuring efficiency is improved.

Description

Technical field: [0001] The invention relates to a photoelectric measuring instrument, in particular to a leveling compensation device in the photoelectric measuring instrument. Background technique: [0002] Most instruments or measuring equipment need to find an accurate measurement reference before each measurement in order to improve the measurement accuracy of the instrument or equipment. For example, levels, theodolites, etc., are required to work at a certain reference level. Compared with the earth's inertial system, due to the effect of the earth's gravitation, the most commonly used and simplest measurement datum is to use the earth's horizontal datum, that is, it is necessary to adjust the instrument or equipment datum to be parallel to the earth's horizontal plane (referred to as adjustment flat). In most engineering surveying applications, equipment or instruments are leveled manually using electronic levels. Usually, when leveling, adjust the knob on the lev...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D18/00G01C25/00G12B5/00
Inventor 李建荣赵雁王志乾高峰端杜璧秀
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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