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Imaging method for high stability interference imaging spectrograph and spectrograph for realizing said method

An interference imaging, high-stability technology, applied in the field of spectrometers, can solve the problems of complex system structure, low scanning speed, low work efficiency, etc., and achieve the effects of high scanning efficiency, low driving power, and simple structure

Inactive Publication Date: 2009-05-06
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0005] The object of the present invention is to provide an imaging method of a high-stability interference imaging spectrometer and a spectrometer for realizing the method, which solves the problem of only single-pixel sampling, low work efficiency, complex system structure, and low scanning speed in the background technology. , technical problems of poor stability

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  • Imaging method for high stability interference imaging spectrograph and spectrograph for realizing said method
  • Imaging method for high stability interference imaging spectrograph and spectrograph for realizing said method

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Embodiment Construction

[0047] See attached figure 1 , the optical system of the present invention is mainly made of collimator lens 1, beam splitter 2, rotating mirror 3, first corner reflector 5, second corner reflector 6, front optical system 10 and Fourier lens 7; Interference system mainly It is composed of a collimating lens 1, a beam splitter 2, a rotating mirror 3, a first corner reflector 5, a second corner reflector 6 and a Fourier lens 7. The detection system is mainly composed of a detector 8, and the information processing system is mainly composed of a computer processing system 11, see figure 2 .

[0048] Working principle of the present invention: when the rotating mirror 3 is stationary, the light beam on the main optical axis is divided into two beams by the beam splitter 2, and the optical paths of the two beams are equal. When the rotating mirror 3 rotates under the drive of the motor 4, the reflected beam I split by the beam splitter 2 for the first time F After multiple refl...

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Abstract

The present invention is a high stability interference imaging spectrograph and its imaging process. The collimating lens converts the light from the target into a parallel beam and the beam splitter separates it into a reflected beam and a transmitted beam. The reflected beam is reflected in the rotating mirror and the corner reflector for several times, returned to the beam splitter and converged by the Fourier lens to the detector to form the first beam optical path. The transmitted beam is reflected in the corner reflector and the beam splitter for several times, returned to the beam splitter and converged by the Fourier lens to the detector to form the second beam optical path. These two beams have optical path difference to the detector so as to form interference spectrogram, which is Fourier transformed in the computer to obtain restored target image. The present invention has simple installation and regulation, low noise level and high real-time property and is suitable for large area scanning.

Description

technical field [0001] The invention relates to a moving-mirror interference imaging method for quickly obtaining target interference spectrum and a spectrometer for realizing the method, in particular to an imaging method for a high-stability interference imaging spectrometer and a spectrometer for realizing the method. Background technique [0002] The earlier imaging spectrometer was the Michelson interferometric time-modulated space imaging Fourier transform spectrometer [D Simenoni. New concept for high-compact imaging Fourier transform spectrometer (IFTS)[ C]. SPIE, 1991, 1479: 127-138.], the Michelson interferometric time-modulated spatial imaging Fourier transform spectrometer developed by Lawrence Livermore Laboratory in the United States in 1995 [Michael R Carter, Charles L Bennett, DavidJ Fields, et al. Live more imaging Fourier transform spectrometer[C]. SPIE, 1995, 2480: 380-386.]. It adopts a linear reciprocating scanning method, and must turn at the end of ea...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/45
Inventor 张文喜相里斌袁艳黄旻苏丽娟陶然
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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