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Optical false proof nondestructive testing apparatus

A non-destructive testing and optical anti-counterfeiting technology, applied in the field of applied optics, can solve the problems of high production cost, complex anti-counterfeiting label production process, sample damage, etc., and achieve the effect of improving service life, improving operation safety, and improving use efficiency.

Inactive Publication Date: 2009-07-08
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the problems of damage to samples caused by the detection process in the background technology, complex anti-counterfeiting label production process, and high production cost, the present invention provides an optical anti-counterfeiting non-destructive testing device

Method used

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  • Optical false proof nondestructive testing apparatus
  • Optical false proof nondestructive testing apparatus
  • Optical false proof nondestructive testing apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0028] Switch 1 is a light touch electronic switch with a spring, the model is KFC-A03-04.

[0029] The battery 2 is a 3V lithium battery.

[0030] The electronic circuit board 3 is an electronic circuit board with six pins, the positive and negative poles of the exciting light source 4 are connected to the a and b pins respectively, the positive and negative poles of the photodetector 10 are connected to the c and d pins respectively, and the output device 12 The positive and negative poles are connected to the e and f pins respectively, such as figure 1 shown.

[0031] The excitation light source 4 is a semiconductor laser (LD). When the room temperature is 20°C, the central wavelength of the emitted laser is 980nm, and the bandwidth of the emitted laser peak is 1nm-3nm. The power is 200mW.

[0032] Exciting light source bracket 5 is a circular plate structure with a certain thickness made of red copper material. There is a through hole on the left side of the circular to...

Embodiment 2

[0043] The only difference between this embodiment and Embodiment 1 is: the excitation light source 4 adopts a light-emitting diode (LED), and the central wavelength of its emitted light is the same as the absorption wavelength of the infrared (up-conversion) fluorescent material, which is 980nm, and the bandwidth of the emitted laser peak It is 5nm-10nm.

Embodiment 3

[0045] The difference between this embodiment and embodiment 1 is:

[0046] The excitation light source 4 is a semiconductor laser (LD). At a room temperature of 20°C, the central wavelength of the emitted laser is 973nm, the bandwidth of the emitted laser peak is 1nm-3nm, and the power is 200mW. The halide material system doped with rare earth elements uses europium (Eu 3+ ) Yttrium (Yb 3+ ) co-doped silicate, after absorbing infrared light with a wavelength of 973nm, the emitted fluorescence characteristic line is visible orange light with a wavelength of 593nm.

[0047] The reflective film on the inner cavity wall of the left sub-chamber cover 14 has high reflectivity to the 973nm near-infrared light emitted by the excitation light source 4, and has high reflectivity to the 593nm visible fluorescence emitted by the infrared (up-conversion) fluorescent material.

[0048] The reflective film on the inner cavity wall of the right sub-chamber cover 15 has a high reflectivity ...

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Abstract

The invention belongs to the field of applied optics, and relates to an optical anti-counterfeit non-destructive detection device for commodities marked with infrared fluorescent materials by using an optical method. It is composed of a switch, a battery, an electronic circuit board, an excitation light source, an excitation light source support, a black chamber sub-cavity, a sub-cavity partition, a filter device, a photoelectric detector, and an output device. The switch of the present invention is connected in series with the battery and the electronic circuit board to form a circuit, the positive and negative poles of the excitation light source are connected with the electronic circuit board, and the excitation light source is fixed on the excitation light source bracket. The light filtering device is located at the light hole of the sub-cavity partition, the photodetector is located in the right sub-cavity, the positive and negative poles of the photodetector are connected with the electronic circuit board, and the positive and negative poles of the output device are connected with the electronic circuit board. The invention has the characteristics of safe operation, long service life and high efficiency of the excitation light source, sensitive reception of the photoelectric detector, low production cost, etc., and truly realizes anti-counterfeiting and non-destructive detection.

Description

technical field [0001] The invention relates to the field of applied optics, in particular to a device for anti-counterfeiting and non-destructive testing of commodities with infrared (up-conversion) fluorescent materials as anti-counterfeiting marks by using an optical method. Background technique [0002] With the rapid development of commodity economy today, the anti-counterfeiting detection of commodities has become an important issue related to the interests of consumers. Non-destructive testing is a new technology that emerged with the development of high technology. This technology is different from traditional chemical analysis methods, does not damage the sample, and ensures the integrity of the sample while obtaining sample information. The anti-counterfeiting detection of biological seeds and daily consumer goods requires no damage to the samples, and it is easy for professional technicians to make accurate judgments on the spot. Therefore, an optical anti-counter...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06K7/10G01N21/64
Inventor 郑权赵岭贾富强
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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