Unlock instant, AI-driven research and patent intelligence for your innovation.

Testing device and testing method

A testing device and testing method technology, applied in the direction of electronic circuit testing, etc., can solve problems such as failure of test results, tearing of flexible circuit board 810, mechanical damage of first connector 820 and second connector 912, etc.

Inactive Publication Date: 2009-09-23
AU OPTRONICS CORP
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the mating and unplugging life of the first connector 820 and the second connector 912 is about 20-50 times. After many times of plugging and unplugging, the first connector 820 and the second connector 912 are prone to mechanical damage.
[0006] In addition, due to the certain bonding force between the first connector 820 and the second connector 912, in the process of separating the first connector 820 and the second connector 912, the flexible material is often torn due to improper application of force. circuit board 810
[0007] The damage to the first connector 820, the second connector 912 or the flexible circuit board 810 caused by the above test method not only often results in invalid test results, but also affects the quality of the electronic component 800 after leaving the factory.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Testing device and testing method
  • Testing device and testing method
  • Testing device and testing method

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0055] Please refer to Figure 2A , which is a schematic diagram of the test device 100 according to the first embodiment of the present invention. The testing device 100 is used for testing an electronic component 700 . The electronic component 700 has a flexible printed circuit board (Flexible Printed Circuits Board, FPC Board) 710 . The test device 100 includes a test board 110 , a support base 120 and at least one thimble 130 . In this embodiment, the supporting base 120 is composed of an upper supporting base 124 and a lower supporting base 125 . The test board 110 has at least one pad 111 . The support base 120 is used for carrying the test board 110 and the electronic component 700 . The thimble pin 130 is disposed on the upper support base 124 and located between the test board 110 and the flexible circuit board 710 . The ejector pin 130 has a first end 131 and a second end 132 , the first end 131 is used for electrically connecting the pad 111 , and the second en...

no. 2 example

[0074] The difference between the test device 200 of this embodiment and the test device 100 of the first embodiment lies in the combination of the cover plate 240 and the support base 220 , and the rest of the similarities will not be repeated. Please refer to Figure 9 , which is a schematic diagram of a test device 200 according to a second embodiment of the present invention. In this embodiment, the cover 240 includes a first magnetic component 249 , and the support base 220 includes a second magnetic component 229 . The first magnetic component 249 and the second magnetic component 229 are magnetically attracted to each other. For example, the first magnetic component 249 and the second magnetic component 229 are a combination of an N pole magnet and an S pole magnet, or a combination of any type of magnet and metal. The cover plate 240 and the support base 220 can be closely combined by magnetic attraction.

[0075] The testing device and testing method of the above-me...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A testing device and testing method. The testing device is used for testing an electronic component. The electronic component has a flexible circuit board, and the test device includes a test board, a support seat and at least one thimble. The test board has at least one pad. The supporting seat is used for carrying the test board and the electronic components. The thimble is arranged on the support base and is located between the test board and the flexible circuit board. The thimble has a first end and a second end, the first end is used for electrically connecting the pad, and the second end is used for electrically connecting the flexible circuit board.

Description

technical field [0001] The present invention relates to a testing device and a testing method, and in particular to a testing device and a testing method of an electronic component. Background technique [0002] With the development of science and technology, the precision of electronic products continues to increase. In the production process of electronic products, a series of testing procedures must be passed to ensure the quality of electronic products. [0003] Generally speaking, an electronic product is composed of many electronic components, such as a display panel, a main control circuit board, or a key control circuit board. For the convenience of space design, a flexible printed circuit board (FPC Board) is often equipped with a connector (Connector) between electronic components, so as to facilitate the connection between various electronic components. [0004] Please refer to figure 1 , which shows a schematic view of a conventional electronic component 800 a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
Inventor 李俊贤
Owner AU OPTRONICS CORP