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Fuse detection circuit and its detection method

A technology for checking circuits and checking methods, applied in information storage, static memory, instruments, etc., can solve problems such as affecting the current flowing through the fuse F1, affecting the fuse F1 blown and other components being damaged, current consumption, etc.

Inactive Publication Date: 2009-10-14
FORTUNE SEMICON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the fuse F1 is not blown, there will be a small current through the fuse F1 and the transistor MN1, and when there are many such fuse trimming cells, it will consume a considerable amount of current
[0005] To sum up, since the known fuse trimming circuit inputs the control signal TRIM into the gate of the transistor MN0, the turn-on voltage of the transistor will be shifted due to the error in the manufacturing procedure of the transistor. The result will affect the magnitude of the current flowing through the fuse F1, which in turn will affect the blowing of the fuse F1 or the damage of other components

Method used

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  • Fuse detection circuit and its detection method
  • Fuse detection circuit and its detection method
  • Fuse detection circuit and its detection method

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Embodiment Construction

[0044] For the characteristics and technical content of the present invention, please refer to the following detailed description and accompanying drawings, and the accompanying drawings are provided for reference and illustration only, and are not intended to limit the present invention.

[0045] Please refer to figure 2 , is a circuit diagram of a fuse inspection circuit according to a specific embodiment of the present invention. In this specific embodiment, the fuse trimming cell can be regarded as a one-time programmable memory for storing digital values ​​(such as "High" and "Low"). The burning inspection circuit of the fuse trimming cell provides two power sources, one is the system voltage source VDD used as the system voltage, and the other is the trimming voltage source VDDF used for blowing the fuse. GND represents the ground voltage of the system, and the label C3 is the fuse trimming circuit. In the fuse trimming circuit C3 , the voltage source VDDF is connecte...

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Abstract

The present invention relates to a fuse detection circuit and its detection method. Said circuit includes first detection circuit which is driven by system voltage source, is used for detecting voltage value of first end of said fuse so as to output first reference voltage; second detection circuit which is driven by system voltage source, is used for detecting voltage value of second end of said fuse so as to output second reference voltage; and analog comparator which utilizes the difference value of first reference voltage and second reference voltage to judge that the fuse is burnt out or not.

Description

technical field [0001] The present invention relates to a fuse inspection circuit and its inspection method, and in particular to a fuse inspection circuit using multiple reference voltages and its inspection method. Background technique [0002] Currently, fuse bits are used in many ways, for example, when a digital value that needs to be permanently programmed into one or more bits. In the application of the temperature sensor, the variation of the temperature parameter of the metal oxide semiconductor (MOS) will change with every manufacturing process. After the chip is completed, the value measured by the non-graded temperature sensor chip is meaningless if it has not been calibrated. Therefore, in this case, the chip must be programmed with additional parameters in order to make it work properly. [0003] As described in U.S. Patent No. 6,654,304, see figure 1 , which shows a fuse trimming circuit, the VDD voltage source is connected to the fuse F1 and connected to t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C17/18
Inventor 黄一洲吴晓龙
Owner FORTUNE SEMICON