Test approach and system of embedded system

Abstract

The invention discloses a test method for an embedded system. A test module is set in the embedded system. The test module stores test parameters and at least one item to be tested. The method includes the following steps: a. Determination of the test module and the item to be tested The corresponding function module to be tested generates a function module execution command corresponding to the project to be tested, and sends the generated function module execution command to the determined function module to be tested according to the test parameters; b, the function module to be tested receives the function of the test module input After the module executes the command, it executes the operation function and outputs the execution result as the test result. The invention also discloses a test system of an embedded system for realizing the above method. Applying the test method and system of the present invention for testing does not require long-term, high-frequency repeated operations, and does not need to write test scripts and test cases, and the test frequency, test times and test time can be flexible and convenient according to test needs Local setting, easy operation, greatly reducing the difficulty of testing.

Description

technical field [0001] The invention relates to testing technology, in particular to a testing method and system for an embedded system. Background technique [0002] Existing testing techniques include manual testing and automated testing. [0003] For embedded systems, when performing manual testing, testers use input devices such as mouse, keyboard, touch screen or remote control to perform long-term and high-frequency repeated operations on the device under test. The disadvantages of this testing method are: a waste of human resources; due to human factors, it will lead to cumulative errors, and the accuracy of the test cannot be guaranteed. For example, testers can maintain a mouse click rate of 3 times per second within one minute to interact with the device under test, but it is difficult to guarantee such an accurate click rate for an hour or several hours. [0004] In the prior art, when using an automatic test system to test an embedded system, testers are requir...

AI Technical Summary

Problems solved by technology

The disadvantages of this testing method are: waste of human resources; due to human factors, it will lead to cumulative errors, and the accuracy of the test cannot be guaranteed

This increases the difficulty of testing and raises the bar for testers

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