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High voltage pmos transistor

A transistor and high-voltage technology, applied in the field of high-voltage PMOS transistors, can solve the problems of transistor withstand voltage strength limitation, small doping pattern, etc., and achieve the effect of high working voltage

Active Publication Date: 2008-02-13
AUSTRIAMICROSYSTEMS AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this document proposes that the withstand voltage strength of the transistor is limited because the retrograde implantations profile in the edge region of the drain extension leads to a less suitable doping pattern

Method used

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Embodiment Construction

[0021] FIG. 4 shows a refinement of the prior art mentioned at the outset, starting from FIG. 4 for a better overall understanding of the invention. According to FIG. 4 , an n-doped well 411 is arranged on a substrate 410 . A highly doped, p-type conducting region 415 is arranged inside the n-well 411 as a source terminal. Next to it is a highly doped, n-type conductive region 416 which can be used as a ground terminal (Body). A channel region K is connected to the other side of the source region 415 , and a gate electrode 418 , for example composed of polysilicon, is arranged above the channel region K insulated by a gate oxide 417 .

[0022] Arranged in the direction of the drain are field oxide regions 413 which have openings for accommodating a highly doped, p-conducting drain 414 . Below the drain 414 and the field oxide region 413 , a p-doped well 412 is arranged inside the n-doped well 411 , which extends laterally into the channel region. The gate electrode 418 exte...

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Abstract

The invention relates to a high-voltage PMOS transistor comprising an insulated gate electrode (18), a p-type source (15) in an n-type well (11), a p-type drain (14) in a p-type well (12), which is located in the n-type well, and a field oxide region (13) between the gate electrode and drain. The depth (A'-B') of the n-type well below the drain (14) is less than its depth below the source (15) and the greatest depth (A'-C') of the p-type well lies below the drain (14).

Description

technical field [0001] The invention relates to a high-voltage PMOS transistor, which has an insulated gate electrode, a p-type conduction source region in an n-type conduction well, and a p-type conduction drain region in a p-type conduction well, the p-type conduction well being arranged in the n-well middle. Background technique [0002] In integrated circuits, the known fabrication of high-voltage transistors generally results in transistors optimized for the desired voltage range. The voltage range can be from greater than 10 volts up to 150 volts and beyond. A typical application is automotive technology, where, in addition to logic circuit elements, switches for the battery voltage level and for controlling disturbance bursts must also be provided. These high-voltage transistors can basically be manufactured by processes as applied to CMOS circuits having a usage range of 3.3 volts or 5 volts. However, this production is complex and expensive, since a number of add...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/78H01L29/10H01L21/336H01L21/266H01L29/06H01L29/08
CPCH01L29/402H01L29/1079H01L29/7835H01L21/266H01L29/66659H01L29/0615H01L29/0847H01L29/1095
Inventor 马丁·克奈普
Owner AUSTRIAMICROSYSTEMS AG
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