Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Abrasion wear process method and device of data block

A processing method and processing device technology, applied in static memory, instruments, etc., can solve problems such as performance degradation, throughput defects, and flash memory does not avoid wear and tear, and achieve the effect of avoiding damage and improving storage life.

Inactive Publication Date: 2008-05-14
SUZHOU ONE WORLD TECH
View PDF0 Cites 18 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Thus, there will be a significant performance penalty at the cost of additional read operations to verify writes and detect failures
This is unacceptable for flash-based devices, where throughput is a drawback relative to disk technology
[0004] The current flash memory does not have a mechanism to avoid wear and tear. If the S.M.A.R.T technology of the disk is introduced into the flash memory, it will not be able to actively prevent wear and tear.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Abrasion wear process method and device of data block
  • Abrasion wear process method and device of data block
  • Abrasion wear process method and device of data block

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0048] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0049] FIG. 1 shows the flow of the first embodiment of the method for processing data block wear of the present invention. Please refer to Figure 1, the following is a detailed description of each step in the method.

[0050] Step S10: When operating on a data block, record its wear record.

[0051] The operation may include reading data, writing data, or reading and writing data. Correspondingly, the wear record may be the number of times of reading data, the number of times of writing data, or the number of times of reading and writing data on the data block. Preferably, the times of writing data on the data block are recorded as wear times.

[0052] The wear record of each data block can be recorded in the storage space of the data block itself, for example, a segment of bytes is reserved in each data block for storing its own wear record. It is ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method and an apparatus for solving the problem of data block wear treatment, which avoids data loss due to premature wear of storage devices caused by frequently writing physical blocks. The technical proposal of the invention includes the following steps: recording the wear records of a data block while the data block is operated; determining standby storage space when the wear records of the data block reach a critical value; updating the mapping from the physical address to the logical address in the data block; transferring the data in the data block to the standby storage space. The invention is applied to the storage device field.

Description

technical field [0001] The invention relates to a method and device for processing data wear, in particular to a method and device for processing wear of data blocks in a storage device based on wear records. Background technique [0002] Existing disk devices use the Self-Monitoring Analysis and Reporting Technology Standard (S.M.A.R.T) with the ability to remap bad disk sectors to unused spare sectors. However, these disk mechanisms basically rely on detecting sector failures at runtime by observing a failed write. These algorithms assume that sector failures are unpredictable and random, so they can only be detected in reverse. [0003] For flash-based devices (e.g. flash cards, USB sticks, arrays of flash modules, etc.), proactive wear prevention is particularly important, because it is more expensive to detect flash block failures during runtime than disk technology . In a magnetic disk, the head can read back just-written data very quickly relative to the slow arm s...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/00
Inventor 舒曼·拉菲扎德保罗·威尔曼林贻基胡英
Owner SUZHOU ONE WORLD TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com