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Method for improving temperature measurement accuracy of modem probe

A temperature measurement accuracy and probe technology, applied in the field of improving the temperature measurement accuracy of a modulation probe, can solve problems such as undisclosed specific methods, avoid the influence of the temperature measurement error of the modulation plate, avoid the influence of the measurement error, and eliminate the probe response curve. effect of influence

Inactive Publication Date: 2008-05-21
BEIJING CTROWELL INFRARED TECHN
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Problems solved by technology

[0004] Literature: A new type of infrared thermal shaft detection system, Journal of Railways, 2005, 27(4), 114-118, pointed out that the disc temperature compensation is used to eliminate the influence of the temperature change of the modulation disc on the calculation accuracy of the shaft temperature, but the specific method is not disclosed

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  • Method for improving temperature measurement accuracy of modem probe
  • Method for improving temperature measurement accuracy of modem probe
  • Method for improving temperature measurement accuracy of modem probe

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Embodiment Construction

[0024] The present invention will be further described in detail below in conjunction with the accompanying drawings.

[0025] The invention provides a method for improving the temperature measurement accuracy of the modulating probe. When the modulating probe detects the temperature, it is not necessary to measure the temperature of the modulating disc, and the temperature of the measured object is not measured with the modulating disc temperature as the background temperature, but the temperature of the measured object is detected. Finally, a reference object is detected, and the probe response curve is corrected according to the probe output of the probe reference object and the reference object temperature, and the temperature of the measured object is calculated according to the corrected probe response curve, which can eliminate the influence of the modulation disc temperature change on the modulation probe measurement. The influence of the temperature accuracy is improve...

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Abstract

The invention provides a method of improving the temperature testing precision of a modulation probe; when the probing temperature of the modulation probe is probed, the temperature of a modulation disc needs not to be measured; the temperature of an object to be measured is not measured by taking the temperature of the modulation disc as the background temperature; after the object is probed, a reference object is probed and the probe responding curve is corrected according to the probe output of the inference object and the temperature of the inference object; the temperature of the object to be measured is calculated according to the corrected probe responding curve, which can eliminate the effect of the change of the temperature of the modulation disc to the temperature testing precision of the modulation probe and improve the temperature testing precision of the modulation probe, thus avoiding the effect of the temperature measurement error of the modulation disc.

Description

technical field [0001] The invention belongs to the field of railway infrared equipment, and relates to a method for improving the temperature measurement accuracy, in particular to a method for improving the temperature measurement accuracy of a modulation probe. Background technique [0002] In the infrared shaft temperature detection system, the calculation of the shaft temperature uses the corresponding relationship curve between the output voltage of the probe and the temperature of the measured object, that is, the probe response curve. For the modulation probe, the infrared radiation obtained by the infrared sensitive element comes from the measured object and the reticle alternately, so the output of the probe corresponds to the temperature difference between the measured object and the reticle. If the temperature of the measured object remains unchanged but the temperature of the retort disc changes, the output of the probe will also change due to the change in the ...

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Application Information

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IPC IPC(8): B61K9/04B61K9/06
Inventor 孙庆张益南振会王新华周立玮曲歌朱波
Owner BEIJING CTROWELL INFRARED TECHN
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