Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for cascade mass spectrometry by using multiple ion traps

A tandem mass spectrometry and ion trap technology, which is applied in the direction of material analysis, mass spectrometer, and material analysis by electromagnetic means, can solve the problems of limited length, small ion storage capacity, and inability to meet high-throughput tandem mass spectrometry analysis, etc. Achieve the effect of reducing instrument production cost, improving sensitivity and analysis efficiency

Inactive Publication Date: 2008-12-10
FUDAN UNIV +1
View PDF3 Cites 44 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

That is to say, the length of a resonant ion trap will be very limited, so its ion storage capacity will be

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for cascade mass spectrometry by using multiple ion traps
  • Method for cascade mass spectrometry by using multiple ion traps
  • Method for cascade mass spectrometry by using multiple ion traps

Examples

Experimental program
Comparison scheme
Effect test
No Example Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the quality analysis technology field and in particular relates to a method of using a plurality of ion traps for the tandem mass spectrometric analysis, including that a high frequency capturing electric field based on a quadrupole field is produced in the first ion trap for capturing ions with various mass-to-charge ratios. A dipolar excitation alternating electric field with certain frequency along the direction of a straight line for connecting the center of the first ion trap center with the center of a second ion trap center is produced in the first ion trap. Thus, the ions with a mass-to-charge ratio oscillate along the direction to reach to the large amplitude under the resonance excitation. Furthermore, a discharged pulse electric field generates in a specific phase of the first ion trap. The ions reaching to the large moving amplitude are discharged and enter the second ion trap. And the ions with other mass-to-charge ratios are still left in the first ion trap. Through a deceleration field added in the second ion trap or the gas collision, the entering ions or byproduct ions are captured and the researching analysis is further made in the second ion trap.

Description

technical field [0001] The invention belongs to the technical field of mass analysis, and in particular relates to a method for mass analysis of ions using two or more ion traps. technical background [0002] Mass spectrometer is a scientific instrument that can be used to analyze various components, contents and molecular structures in material samples. Ion trap mass spectrometer is one of the mass spectrometers widely used at present. It has the characteristics of simple structure, convenient operation and relatively cheap price. It is widely used in various fields such as chemistry, life science, geological science, petrochemical industry, medicine and health, environmental protection, food safety, etc. [0003] Traditional ion traps can be divided into three-dimensional ion traps and linear ion traps according to their different structures. The shape of the electrode constituting the ion trap includes a hyperbolic electrode, a cylindrical electrode, or a rectangular e...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N27/64H01J49/26
CPCH01J49/423H01J49/004H01J49/427
Inventor 蒋公羽罗婵丁传凡丁力
Owner FUDAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com