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Flash memory detection classification method

A classification method, flash memory technology, applied in static memory, instruments, etc., can solve problems affecting flash memory usage, flash memory instability, etc.

Inactive Publication Date: 2009-02-18
SHENZHEN CHIPSBANK TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0014] Even so, due to the instability of flash memory, if a good block during scanning is found to be a bad block during use, it will affect the use of flash memory

Method used

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Embodiment Construction

[0035] The invention provides a flash memory detection and classification method, comprising the steps of: extracting some flash memory samples according to the flash memory category; scanning the flash memory samples in read and write operation modes; finding out the characteristics of the flash memory according to the scanning results; and setting the flash memory with the same characteristics on the control chip On the test stand produced by the manufacturer; connect the test stand to the host computer; scan the good and bad blocks of the flash memory according to the characteristics of the flash memory through the mass production tool installed in the computer; divide the flash memory into different grades according to the scanning results .

[0036] In this detection and classification method, it mainly adopts a special scanning method before the static classification, that is, the read-write operation mode scans the flash memory sample, and each flash memory has its chara...

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Abstract

The invention discloses a method for detecting and classifying a flash memory, which comprises extracting parts of the flash memory samples based on the classification of the flash memory; scanning the flash memory samples using reading and writing operation modes; looking out the characteristics of the flash memory according to the scanning results; respectively arranging the flash memories with the same characteristic on the test rack produced by the control chip factory; scanning conditions of good and bad blocks of the flash memory according to the characteristics of the flash memory by a measuring tool; classifying the flash memories for different grades according to the scanning results; obligating a set of good blocks in the flash memory as replacing blocks; replacing the bad block with a block in the set of good blocks if finding bad blocks by detection. Because the invention uses the special scanning method before the existing static classification method, so the invention is more exact than only using the static classification method, in addition, the invention can perform dynamical compensation using the method of replacing the bad block, can reduce error probability of the flash memory for the classified flash memories, and the flash memory can be better used.

Description

technical field [0001] The invention relates to the field of flash memory storage, in particular to a method for detecting and classifying flash memory, which can accurately classify flash memory and make full use of the capacity of flash memory. Background technique [0002] Flash memory: Flash memory is the transliteration of Flash Ram. As a non-volatile (simply speaking, data will not be lost without power on, which is different from the commonly used computer memory) semiconductor memory chip, flash memory has the characteristics of small size, low power consumption, and not easy to be damaged by physical damage. Advantages, it is an ideal storage medium for mobile digital products. At present, it is widely used in digital TVs, digital camcorders, mobile phones, digital cameras, PDAs, game consoles, MP3 players and other devices. The types of flash memory are roughly It is divided into two types: data storage type (NAND) with large storage capacity and code storage type...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/00
Inventor 范勤
Owner SHENZHEN CHIPSBANK TECH
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