System and method for testing thin film thermoelectricity material Seebeck coefficient

A testing system and Seebeck coefficient technology, applied in the direction of material analysis, material analysis, material resistance, etc. by electromagnetic means, can solve the problems that there are no applicable thin-film thermoelectric material instruments, etc.

Active Publication Date: 2009-04-22
TIANJIN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The current commercial Seebeck coefficient testers for thermoelectric materials are all designed and manufactured for bulk ...

Method used

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  • System and method for testing thin film thermoelectricity material Seebeck coefficient
  • System and method for testing thin film thermoelectricity material Seebeck coefficient
  • System and method for testing thin film thermoelectricity material Seebeck coefficient

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Embodiment Construction

[0025] Below in conjunction with accompanying drawing, the present invention will be described in further detail:

[0026] figure 1 and figure 2It is a schematic diagram of the appearance structure of the test device and a section view of part of the internal structure. The test device consists of a sample support frame cover 1, a sample support frame 2, a heating block 3, a sample to be tested 4, an insulating sheet 5, a sample fixing card 6, a sample fixing card fixing screw 34, a sample temperature measuring thermocouple 7. Sample chamber temperature measuring thermocouple 8, sealing clamp 9, outer lead interface 10, outer lead tee 11, sample support frame connection port 22, sample chamber heater 23, sealing ring 24, tee sealing cover 35 and so on. The inside of the sample support frame cover 1 forms a sample chamber for placing the sample to be tested. The sample 4 to be tested is placed on the insulating sheet 5 on the sample support frame 2, and is in close contac...

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PUM

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Abstract

The invention relates to a system used for testing Seebeck coefficient of film thermoelectric material and a method thereof. The system comprises a testing device and a control and test circuit system; the sample to be tested is arranged on an insulative sheet on a sample supporting frame and closely contacts with two thermocouples used for measuring the temperature of the sample by a sample fixed clamp; temperature difference is established in the sample to be tested by an electric heating block which is arranged at one side of the sample to be tested; furthermore, the temperature of the film thermoelectric material at the position where the thermocouple is arranged is measured by the two thermocouples which are used for measuring the temperature of the sample and intermittently distributed along the temperature difference direction; the Seebeck electromotive force generated by the sample inside the film thermoelectric material at the position where the thermocouple is arranged is measured by the Seebeck electromotive force measuring line educed by one of two leads which are respectively arranged in the two thermocouples used for measuring the temperature of the sample. The structure used for testing Seebeck coefficient of the film thermoelectric material and the method thereof can quickly and exactly measure the Seebeck coefficient of the film thermoelectric material and solve the problem that the Seebeck coefficient of the film thermoelectric material can not be measured at present.

Description

technical field [0001] The invention relates to a thermoelectric material performance testing technology in the field of material science, in particular to a system and method for testing the Seebeck coefficient of a thin-film thermoelectric material. Background technique [0002] Thermoelectric material is a functional material that can realize mutual conversion between thermal energy and electrical energy, and has a wide range of applications in thermoelectric power generation, refrigeration and sensors. The Seebeck coefficient is an important index to evaluate the performance of thermoelectric materials. The Seebeck coefficient is defined as follows: when there is a temperature difference between the two ends of the thermoelectric material ΔT=T 1 -T 2 , and T 1 >T 2 , there will be a potential difference E between the two ends of the thermoelectric material ab appears with the value: [0003] E. ab = α ab ΔT (1) [0004] (1) where α ab is a constant, which is...

Claims

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Application Information

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IPC IPC(8): G01N27/00G01N27/14
Inventor 王为李菲晖李晋楼
Owner TIANJIN UNIV
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