Remote sensing inversion method for moon surface reflective index
A technology of surface albedo and remote sensing inversion, which is applied in the field of lunar surface albedo remote sensing inversion
Inactive Publication Date: 2009-06-17
SHANGHAI UNIV
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The research on remote sensing inversion of lunar surface albedo in this paper is an original research, and there are no relevant reports in relevant literature
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[0031] A preferred embodiment of the present invention is described as follows with reference to the accompanying drawings: Compared with the earth, there is no atmosphere on the surface of the moon, so the influence of the atmosphere can be ignored. Therefore, the pixel irradiance of the remote sensing image of the lunar surface is mainly composed of two parts: the direct solar irradiance and the adjacent slope reflected irradiance. ie E ij =E sij +E rij . Among them, E ij ,E sij and E rij They are the light radiation illuminance on the ground of the remote sensing image pixel on the lunar surface, the direct sunlight illuminance component and the adjacent slope reflected illuminance component. The remote sensing value of the pixel also has the same relationship: DN ij =DN sij +DN rij =K·R ij ·E ij / π=K·R ij ·(E sij +E rij ) / π. Among them, DN ij 、DN sij DN rij They are the remote sensing value of the remote sensing image pixel of the lunar surface, the remot...
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The invention relates to a remote sensing inversion method for lunar surface reflectivity. In the method, a point-by-point inversion of the lunar surface reflectivity is carried out based on DEM data and remote sensing images of the lunar surface. Firstly, shadows of the remote sensing images are judged by utilizing the DEM and solar direction parameters, which match the remote sensing images, including solar altitude angles, so that pixels of the remote sensing images of the lunar surface are divided into two categories, including non-shadow pixels and shadow pixels and different methods are adopted for the reflectivity inversion on the two categories. As to the non-shadow pixels, the reflectivity is inverted by computing illumination intensity of direct sunlight and illumination intensity of reflected radiation of a neighboring slope by repeated iteration; as to the shadow pixels, the reflectivity is inverted by the illumination intensity of reflected radiation of the neighboring slope. The computation method of the inversion is original and is of great significance for remote sensing exploration of celestial bodies (including the moon) which human beings can not actually measure point by point with instruments. The method has important value in theory and technology of lunar exploration and methodology and epistemology of lunar study.
Description
Technical field: [0001] The invention relates to a method for remote sensing inversion of lunar surface reflectance, which belongs to the field of remote sensing technology and surveying and mapping. Background technique: [0002] The study of target spectral characteristics (including reflectivity) is the necessary basis and foundation for remote sensor parameter selection, remote sensing experiment planning, target feature information extraction, and remote sensing image processing and analysis. The reflectivity of the lunar surface is also a necessary parameter for the calculation of the reflected radiation on the adjacent slope of the lunar surface. Using lunar remote sensing data to perform point-by-point inversion calculation of lunar surface reflectance. Due to the difference between the environment of the moon and the earth, this technology is significantly different from the conventional ground albedo remote sensing inversion. For celestial bodies that humans cannot...
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IPC IPC(8): G01S7/48
Inventor 李先华罗庆洲黄微黄睿曾齐红常静
Owner SHANGHAI UNIV