Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for analyzing and processing turnout curves

A technology of curve analysis and processing method, which is applied in the direction of electrical equipment used to manipulate turnouts or line breakers, railway car body parts, railway signals, etc., and can solve the problem of low accuracy, no analysis ability of fault curves, and high impact on railway fields Automation and other issues to achieve high efficiency

Inactive Publication Date: 2009-08-26
CASCO SIGNAL
View PDF0 Cites 18 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, there is no mature method for analysis and processing of turnout curves. Most of the existing methods have low accuracy and have no ability to analyze fault curves that have not occurred before. This has caused great inconvenience and affected the overall highly automated railway field. develop

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] The present invention will be further described below in conjunction with specific examples.

[0014] A method for analyzing and processing turnout curves, the method comprising: polling the turnout curves and calling the standard failure curves in the standard failure curve library to judge one by one; if the result of the standard failure is met, the failure content is displayed; Call the non-standard fault experience database; if the non-standard fault curve matching the current curve is directly found in the non-standard fault experience database, the current curve is considered to be such a fault; if the current curve cannot match the non-standard fault curve in the non-standard fault experience database If the fault curve does not match the standard curve at the same time, it is considered as a new fault type; the current curve is stored in the non-standard fault experience database.

[0015] Each group of turnout equipment will configure the curve analysis accord...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method for analyzing and processing turnout curves. The method comprises the following steps: judging standard fault curves in a turnout curve polling and calling standard fault curve database one by one; if the standard fault curves conform to a standard fault result, displaying the fault content; if no fault is found during the polling of all the standard fault curves, calling a non-standard fault experience database; if non-standard fault curves which are matched with the current curves are directly found in the non-standard fault experience database, determining that the current curves have the faults; if the current curves cannot be matched with the non-standard fault curves in the non-standard fault experience database, and cannot be matched with the standard curves at the same time, determining that the curves have a novel fault type; and storing the current curves in the non-standard fault experience database. The accuracy of the standard fault curve database of the method is higher, but the application range is narrower; while the accuracy of the non-standard fault experience database is not very high, but the non-standard fault experience database can judge whether the curves have the faults or not within a wider range, and the accuracy and the wider range. The standard fault curve database and the non-standard fault experience database complement each other to achieve high efficiency.

Description

technical field [0001] The invention relates to the fault analysis of the turnout starting current or the power curve of the turnout generated during the rotation of various turnouts, in particular to a method for analyzing and processing the turnout curve. Background technique [0002] At present, there is no mature method for analysis and processing of turnout curves. Most of the existing methods have low accuracy and have no ability to analyze fault curves that have not occurred before. This has caused great inconvenience and affected the overall highly automated railway field. develop. Contents of the invention [0003] The object of the present invention is to provide an efficient and practical method for analysis and processing of turnout curves in order to overcome the above-mentioned defects in the prior art. [0004] The purpose of the present invention can be achieved through the following technical solutions: a turnout curve analysis and processing method, whic...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): B61L5/06
Inventor 涂鹏飞胡恩华魏盛昕江林佳张剑朱锁明
Owner CASCO SIGNAL
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com