Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Embedded spectrum and radiation real-time calibration device

An embedded, spectroscopic technology, applied in the field of spectroscopy and radiation measurement, which can solve problems such as inability to perform real-time calibration

Inactive Publication Date: 2010-11-10
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The internal calibration device of the instrument usually uses sunlight or a calibration lamp as the light source. The internal calibration device of quite a few instruments currently in operation only has the function of radiation calibration, and most of them cannot perform real-time calibration; in addition, for deep space exploration spectroscopy instruments For example, the calibration device is required to be light and miniaturized

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Embedded spectrum and radiation real-time calibration device
  • Embedded spectrum and radiation real-time calibration device
  • Embedded spectrum and radiation real-time calibration device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an embedded spectrum and radiation real-time calibration device. The device comprises a line-array light source component and a field stop component. The line-array light source component is composed of a light source 1, a parabolic reflector 2, a coupling lens 3 and optical fiber 4. The design of the field stop component 5 allows imaging beams and calibration beams to be capable of entering a subsequent light path of an imaging spectrometer and finally being converged on an area array detector, calibration data are obtained when the imaging spectrometer acquires images of each frame, thus realizing complete real-time spectrum and radiation calibration, meanwhile, the device is embedded inside the imaging spectrometer to meet the light and miniaturization design requirements of instruments.

Description

Embedded spectrum and radiation real-time calibration device Technical field The invention belongs to the field of spectroscopy and radiation measurement, and specifically refers to an embedded spectroscopy and radiation real-time calibration device, which is integrated in the spectrometer and simultaneously meets the requirements of imaging spectrometer spectrum and radiation real-time calibration. Background technique The imaging spectrometer obtains the target's spectral information with high spectral resolution while acquiring the target spatial information, so as to realize the identification of the ground object. It is used in the national economy such as land resource survey, agriculture and forestry, environment and disaster monitoring, digital city, etc. And military applications such as false target recognition are becoming more and more extensive. With the improvement of the level of area array detectors and spectroscopic devices, staring imaging spectrometers have ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/00
Inventor 何志平王建宇舒嵘吴金才贾建军沈渊婷
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products