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Sputtering target and oxide semiconductor film

A sputtering target and oxide technology, which is applied in the field of sputtering targets and oxide semiconductor films, can solve the problems of unrecorded sputtering targets, no specific resistance value, etc. The effect of abnormal discharge

Active Publication Date: 2013-06-12
IDEMITSU KOSAN CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Furthermore, although it is described that it can be used in semiconductor elements, there is no description related to the specific resistance value, and there is no description that it can be used in sputtering targets.

Method used

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  • Sputtering target and oxide semiconductor film
  • Sputtering target and oxide semiconductor film
  • Sputtering target and oxide semiconductor film

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0257] In by weight ratio 2 o 3 : Ga 2 o 3 :ZnO=45:30:25, the weighing specific surface area is 6m 2 / g and indium oxide powder with a purity of 99.99% and a specific surface area of ​​6m 2 / g of gallium oxide powder with a purity of 99.99% and a specific surface area of ​​3m 2 / g and zinc oxide powder with a purity of 99.99%, mixed and pulverized using a wet media agitation mill. In addition, 1 mmφ zirconia beads were used for the media of the wet media agitation mill.

[0258] Then, the specific surface area after the mixing and pulverization of each raw material was increased by 2m compared with the specific surface area before pulverization. 2 / g, it was dried with a spray dryer. The obtained mixed powder is filled into a mold and press-molded with a cold press to form a molded body.

[0259] The obtained molded body was sintered in an oxygen atmosphere at a high temperature of 1400° C. for 4 hours while circulating oxygen gas. In this way, a sintered body with a ...

Embodiment 2

[0263] Approximately In by weight ratio 2 o 3 : Ga 2 o 3 : ZnO=55:25:20 Weigh indium oxide powder with a median particle size of 1.5 μm, gallium oxide powder with a median particle size of 2.0 μm, and zinc oxide powder with a median particle size of 1.0 μm, and stir with a wet medium Mill for mixing and crushing. In addition, 1 mmφ zirconia beads were used for the media of the wet media agitation mill.

[0264] After that, the average median diameter of each raw material after mixing and pulverization was 0.8 μm, and then dried with a spray dryer. The obtained mixed powder is filled into a mold and press-molded with a cold press to form a molded body.

[0265] The obtained molded body was sintered in an oxygen atmosphere at a high temperature of 1400° C. for 4 hours while circulating oxygen. In this way, a sintered body with a density of 6.14 g / cm can be obtained without the calcining process. 3 Sintered body for IGZO sputtering target. The presence of ZnGa in the sint...

Embodiment 3

[0268] Approximately In by weight ratio 2 o 3 : Ga 2 o 3 :ZnO=35:25:40 Weigh indium oxide powder with a median particle size of 1.5 μm, gallium oxide powder with a median particle size of 2.0 μm, and zinc oxide powder with a median particle size of 1.0 μm, and use a wet Mixing and pulverization was carried out in a media agitation mill, and zirconia beads of 1 mmφ were used as media in a wet media agitation mill.

[0269] After that, the average median diameter of each raw material after mixing and pulverization was 0.8 μm, and then dried with a spray dryer. The obtained mixed powder is filled into a mold and press-molded with a cold press to form a molded body.

[0270] The obtained molded body was sintered in an oxygen atmosphere at a high temperature of 1400° C. for 4 hours while circulating oxygen. In this way, a sintered body with a density of 6.02 g / cm can be obtained without the calcining process. 3 Sintered body for IGZO sputtering target. The presence of ZnGa i...

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Abstract

Disclosed is a sputtering target containing an oxide of indium (In), gallium (Ga) and zinc (Zn), which specifically contains a compound expressed as ZnGa2O4 and a compound expressed as InGaZnO4.

Description

technical field [0001] The present invention relates to a sputtering target and an oxide semiconductor film. Background technique [0002] Oxide semiconductor films made of metal composite oxides have high mobility and visible light transmittance, and are currently used in switches for liquid crystal display devices, thin film electroluminescent display devices, electrophoretic display devices, and powder transfer display devices. Components, drive circuit components, etc. [0003] Examples of the oxide semiconductor film formed of metal composite oxides include oxide semiconductor films formed of oxides of In, Ga, and Zn (IGZO). An oxide semiconductor film formed using an IGZO sputtering target has the advantage of having a higher degree of mobility than an amorphous silicon film, and is currently attracting attention (Patent Documents 1 to 10). [0004] Known IGZO sputtering target with InGaO 3 (ZnO) m (m is an integer of 1 to 20) The compound shown is a main component...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C23C14/34C04B35/00
Inventor 井上一吉矢野公规宇都野太
Owner IDEMITSU KOSAN CO LTD