Combined three-dimensional digital imaging method of digital speckle projection and phase measuring profilometry
A phase measurement profile and digital speckle technology, which is applied to measuring devices, instruments, optical devices, etc., can solve the problems of large computational complexity and low data accuracy
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[0090] The structure of the actually designed 3D digital imaging system is as follows: figure 1 shown. 101 is a digital projector, 102 is a left camera, 103 is a right camera, 104 is a computer, and 105 is a sample.
[0091] The internal and external parameters of the left and right cameras of the system are:
[0092] Intrinsic parameters of the left camera: K l = 3095.68 0 646.671 0 3095.42 535.397 0 0 1 pixel
[0093] Intrinsic parameters of the right camera: K r = ...
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