Method and system for measuring bias points of double-parallel modulator

A dual-parallel modulator and measurement method technology, which is applied in the field of access network, can solve problems such as high cost and mutual interference, and achieve the effects of improving efficiency, reducing interference, and simplifying the system structure

Inactive Publication Date: 2010-01-06
HUAWEI TECH CO LTD
View PDF0 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0015] The existing technology uses multiple scrambling frequencies for control, which will

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for measuring bias points of double-parallel modulator
  • Method and system for measuring bias points of double-parallel modulator
  • Method and system for measuring bias points of double-parallel modulator

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0038] see Figure 4 , the dual parallel modulator bias point measurement system provided by the embodiment of the present invention consists of a dual parallel modulator 1 (DPMZ1), a controller 2, a bias controller 3 (BC, Bias Control), and a detection circuit 4.

[0039] First of all, the so-called bias point of the dual-parallel modulator actually refers to the voltage value that makes the two MZM modulators and the phase modulation modulator in the dual-parallel modulator work stably. Therefore, to measure the bias point, that is When the MZM modulator and the phase modulation modulator in the dual parallel modulator work stably, the initial voltage and the half-wave voltage of the bias controllers connected to the two MZM modulators and the phase modulation modulator are measured.

[0040] The controller 2 is connected to each port of the dual parallel modulator 1 (DPMZ1) to be detected through the bias controller 3 and the bias T10, and connected to the detection circuit...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The embodiment of the invention discloses a method and a system for measuring bias points of a double-parallel modulator, wherein the method comprises the following steps: controlling the amplitude value of the bias voltage acting on the double-parallel modulator to increase progressively through a first step value; converting an optical signal output by the double-parallel modulator under the action of the bias voltage into an electric signal; detecting the amplitude value of the electric signal, and stopping the progressive increase of the amplitude value of the bias voltage when the amplitude value of the electric signal satisfying the condition for measuring the bias points appears; and using a second step value to scan the amplitude value of the bias voltage corresponding to the amplitude value of the electric signal satisfying the condition for measuring the bias points according to the corresponding relation between the amplitude value of the electric signal and the amplitude value of the bias voltage, and calculating the bias points, wherein the first step value is larger than the second step value. By adopting the embodiment of the invention, the method and the system have the advantages of reducing the interferences between a plurality of frequencies and improving the efficiency of measuring the bias points.

Description

technical field [0001] The invention relates to the access network technology of the mobile communication network, in particular to a method and system for measuring the bias point of a dual parallel modulator. Background technique [0002] The signal will be affected by dispersion during the transmission in the optical fiber. The so-called dispersion is the waveform distortion of the signal caused by the different frequency components of the signal transmitted in the optical fiber or the various mode components of the signal. The main impact of dispersion on optical transmission It is to cause inter-symbol interference between data pulses, and the damage caused by dispersion to system performance cannot be ignored. Generally, optical fiber transmission systems with a transmission rate above 10Gbit / s require dispersion compensation technology to ensure the transmission function of the system. [0003] The dispersion compensation technology widely used at present is to realiz...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H04B10/08H04B10/155H04B10/071H04B10/2513H04B10/548
Inventor 陶智慧陈志强
Owner HUAWEI TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap