Height gage and height measuring method

Abstract

The invention provides a height gage, comprising a base, a guide pillar, an extension rod and a measuring part, wherein, the guide pillar is fixed on the base; the extension rod comprises a sliding part which can be sheathed on the guide pillar in a slideable manner and is used for axial movement along the guide pillar; the measuring part is arranged at one end of the extension rod far from the guide pillar, and comprises a reference rod, a height measuring meter, a measuring rod, a fixed bracket, a first probe and a second probe, wherein, the reference rod is fixed on the extension rod; the height measuring meter is fixed on the reference rod; the measuring rod can be sheathed on the reference rod in a slideable manner; the fixed bracket is connected with one end of the measuring rod far from the reference rod; the first probe and the second probe are connected with the fixed bracket in a rotatable manner; there is provided a predetermined angle between the first probe and the second probe; and the ends of the first probe and the second probe are simultaneously and closely contacted to the surface to be measured. The invention also provides a height measuring method utilizing the above height gage.

Description

technical field [0001] The invention relates to height measurement technology, in particular to a height gauge for measuring height and a method for measuring height by using the height gauge. Background technique [0002] As an important aspect of measurement technology, height measurement has attracted much attention for its convenience and accuracy. For example, in the paper A Novel Optical Method of Dimension Measurement of Objects with Circular Cross-section published by Tomas Fischer et al. at the 2006 IEEE International Symposium on Systems, Instruments and Measurement Technology (Instrumentation and Measurement Technology Conference), a height measurement method is disclosed. . [0003] Height measurement is mainly divided into two categories: non-contact measurement and contact measurement. In contact measurement, a height gauge is generally used as the main measurement tool. At present, the height gauge 300 is mainly composed of a base 310, a guide column 320, a...

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Problems solved by technology

However, because the annular surface 230 is too narrow, it is difficult for the measuring rod 340 to be in close contact with the annular surface 230. Even if it is barely in contact, the element 200 to be measured will be tilted, so that the height gauge 300 cannot be accurately adjusted according to the measurement reference plane. , so that the measurement fails or the measurement error is too large when measuring the height distance between the upper surface 220 and the annular surface 230

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