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Method and device for testing thermal physical property of solid material with independent probe by using harmonic method

A solid material and testing device technology, applied in the direction of material thermal development, material thermal conductivity, etc., can solve difficulties, repeatedly prepare micro-metal strip insulation and other problems, and achieve the effect of ensuring non-destructive testing

Active Publication Date: 2010-07-21
INST OF ENGINEERING THERMOPHYSICS - CHINESE ACAD OF SCI
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  • Abstract
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  • Claims
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Problems solved by technology

[0003] The purpose of the present invention is to solve the technical defects that the existing 3ω measurement technology based on harmonic detection needs to repeatedly prepare micro-metal strips and insulation difficulties. The sample to be tested is insulated, and can be used for simultaneous testing of thermal conductivity and thermal diffusivity of metals, ceramics and other conductive and non-conductive solids and films, and a method and device for testing thermal properties of solid materials by harmonic method with independent probes

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  • Method and device for testing thermal physical property of solid material with independent probe by using harmonic method
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  • Method and device for testing thermal physical property of solid material with independent probe by using harmonic method

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Embodiment Construction

[0033] Various details involved in the technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be pointed out that the described embodiments are only intended to facilitate the understanding of the present invention, rather than limiting it in any way.

[0034]The invention relates to a method for testing thermal properties of solid materials by harmonic method with an independent probe, which involves replacing the technical scheme of directly depositing the probe on the surface of the sample with a structure in which a miniature independent probe is sandwiched between two identical samples to be tested. Non-destructive testing of the thermal physical parameters of the samples to be tested. The optimum torque value should be calibrated with a standard red copper sample before testing. The steps to implement the method by using the harmonic method solid material thermophysical property testing devi...

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Abstract

The invention relates to a method and a device for testing the thermal physical property of a solid material with an independent probe by using a harmonic method. The device comprises the independent probe, a pressure adjusting part, a torque measuring part and a harmonic measuring unit, wherein the independent probe is positioned between two identical samples to be tested to form a sandwich structure and is arranged parallel to a sample fixing table; the pressure adjusting part is positioned and pressed on the upper end face of the first sample to be tested; the sandwich structure is arranged on the sample fixing table; the torque measuring part is sleeved on one end of the pressure adjusting part; the harmonic measuring unit is electrically connected with the independent probe; and a torsion value and contact thermal resistance between the independent probe and the two samples to be tested are fitted and calculated according to a harmonic measurement principle. In the test, the sandwich structure is arranged on a lug boss of the sample fixing table, the pressure adjusting part is adjusted until the torsion value is displayed to be the optimal torsion value, and then the thermal conductivity coefficient and the thermal diffusivity of the sample to be tested are tested by the harmonic method. Differences among thermal conductivity values of the samples to be tested under the condition of a plurality of torsion values smaller than the optimal torsion value are measured and calculated for obtaining the contact thermal resistances between the samples to be tested and the independent probe under the condition of the plurality of torsion values.

Description

technical field [0001] The invention relates to a method and device for measuring thermophysical parameters (thermal conductivity, thermal diffusivity, etc.) Method and apparatus for parametric non-destructive testing. Background technique [0002] In the past two decades, the 3ω measurement technology based on harmonic detection has been considered as an effective means to measure the thermophysical parameters of solids and thin films. The method of its realization is roughly to prepare a micro-metal strip with a certain size and shape on the surface of the material to be tested, and use the micro-metal strip as a heater and a temperature sensor at the same time, and then calculate the temperature of the material to be tested according to the relationship between the frequency of the thermal wave and the temperature change. thermophysical parameters. At present, this method is mainly used to test the thermal physical parameters of non-conductive solids and thin films. Fo...

Claims

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Application Information

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IPC IPC(8): G01N25/20G01N25/18
Inventor 郑兴华邱琳唐大伟
Owner INST OF ENGINEERING THERMOPHYSICS - CHINESE ACAD OF SCI
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