Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Random verification method and device for verifying processor chip after manufacturing

A post-processor, random verification technology, applied in software testing/debugging and other directions, can solve the problem that random verification methods cannot be directly applied to chip verification, and achieve the effect of satisfying coverage and improving verification efficiency.

Active Publication Date: 2010-09-08
LOONGSON TECH CORP
View PDF1 Cites 23 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] The purpose of the present invention is to provide a random verification method and device for post-manufacturing processor chip verification. Through the method and device, the problem that the existing random verification method before chip manufacturing cannot be directly applied to the chip verification after manufacture can be solved. , to meet the needs of using random verification technology to improve chip verification after manufacture and improve verification efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Random verification method and device for verifying processor chip after manufacturing
  • Random verification method and device for verifying processor chip after manufacturing
  • Random verification method and device for verifying processor chip after manufacturing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] In order to make the object, technical solution and advantages of the present invention clearer, the random verification method and device for manufacturing post-processor chip verification of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention rather than limit the present invention.

[0041] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0042] According to a specific embodiment of the present invention, a random verification method for verification of post-manufacturing processor chips is provided. The method includes two parts: a random command generation method and a platform loading method for post-manufacturing chip verification.

[0043] A method for generating random instructions for...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a random verification method and a device for verifying a processor chip after manufacturing. The method comprises the following steps: adding constraints related to a reserved register and a reserved memory address in a command template; adding a register initializing program generator, a memory initializing program generator and a command counter; modifying a random program generating engine, removing an original register initializing file generating mechanism and an original memory initializing file generating mechanism and changing the original command sequence generating and terminating conditions; adding a random generating program recorder, a register comparison program generator and a memory comparison program generator; converting a file generated by using the random command generating method for verifying the processor chip after manufacturing into a file format which can be dispatched by a software platform; assigning initial positions at which different program code segments are loaded in the memory; and loading the program code segments converted into the file format which can be dispatched by the software platform into the corresponding memory addresses according to the assigned initial positions.

Description

technical field [0001] The invention relates to the field of very large scale integrated circuit (VLSI) design verification, and in particular to a random verification method and device for verification of post-manufacturing processor chips. Background technique [0002] It is an important and arduous task to verify the design and process of LSI to ensure its correctness. At present, before a chip is taped out, the correctness of the chip is mainly ensured through functional verification, and after the chip is taped out, the existing errors are found through the chip verification after manufacturing to further ensure the correctness of the chip. With the advancement of research, the means of functional verification before chip manufacturing are becoming more and more abundant and perfect, providing strong support for the verification of integrated circuits, but the functional verification before chip manufacturing is not a complete enumeration process, and cannot be guarante...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 沈海华黄静王朋宇
Owner LOONGSON TECH CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products