Non-lighting inspection apparatus

An inspection device and non-lighting technology, applied in measuring devices, nonlinear optics, material analysis through optical means, etc., can solve problems such as light leakage, image scatter, and blur

Inactive Publication Date: 2010-11-17
NIHON MICRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] However, when light is continuously irradiated from the backlight arranged on the lower side of the conveyor to the CCD camera mounted on the upper side of the conveyor, smears and image blooming occur, making it impossible to

Method used

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Examples

Experimental program
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Effect test

no. 1 Embodiment approach

[0021] The non-lighting inspection device of this embodiment is assembled on a conveying device for conveying panels to be inspected. The conveying device is a general device installed on the production line of the panel to be inspected. figure 1 An example of this conveying device is shown. figure 1 The conveying device 11 in is a device that conveys the panel 2 to be inspected using a conveyer roller 13 supported by a drive shaft 12. The conveying device 11 connects a plurality of processing devices provided on the production line of the panel to be inspected, etc., respectively.

[0022] In the conveying device 11, a plurality of drive shafts 12 arranged at constant intervals are attached between the two side wall portions 14, respectively. A plurality of conveying rollers 13 are attached to each drive shaft 12. The drive shaft 12 is connected to a belt or the like not shown, and power is applied, so that the conveying roller 13 can be rotated. By respectively driving and ro...

no. 2 Embodiment approach

[0043] Next, the second embodiment of the present invention will be described. The overall configuration of the non-lighting inspection device of this embodiment is the same as the non-lighting inspection device of the first embodiment described above, and therefore the same reference numerals are given to the same members, and the description thereof is omitted.

[0044] The device of this embodiment can also be applied to the case where the panel size of the panel 2 to be inspected is changed. When the panel size of the panel 2 to be inspected is changed under the condition that the light irradiation range of the backlight 31 is constant, the light emitted from the backlight 31 either overflows from the panel 2 to be inspected or cannot illuminate the entire panel 2 to be inspected. In order to solve this problem, the shading plate 15' is used. The shading plate 15' is a light control plate that controls the light emitted from the backlight 31 so that the light enters the line...

no. 3 Embodiment approach

[0050] Next, a third embodiment of the present invention will be explained. The overall configuration of the non-lighting inspection device of this embodiment is the same as the non-lighting inspection device of the above-described first embodiment, and therefore the same reference numerals are given to the same members, and the description thereof is omitted. The non-lighting inspection apparatus of this embodiment has a polarizing plate.

[0051] Figure 7 This shows an example of performing non-lighting inspection on the panel 2'to be inspected without the polarizer 4. When inspecting the panel 2'to be inspected without the polarizer 4, all the light emitted from the backlight passes through the panel 2'to be inspected, so that the panel to be inspected cannot be judged because the high-brightness light enters the line scan camera 22 2'Is it a qualified product or a defective product. Therefore, the light control board 4'is provided in this embodiment. The light control pla...

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PUM

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Abstract

The invention provides a non-lighting inspection apparatus capable of restraining fuzzy generation, image fringe phenomenon appearance, and the like to perform exact inspection, and capable of modulating the light of the backlight lamp. The apparatus is used to perform non-lighting inspection to the panel to be detected. The apparatus includes: a linear array camera, provided opposite to the conveying apparatus, for acquiring the image of the panel to be inspected conveyed by the conveying apparatus; a backlight lamp, configured opposite to the linear array camera, and irradiating the light on the panel to be inspected; a sensor for detecting panel, which detects the position of the panel to be inspected conveyed by the conveying apparatus at upstream side of the linear array camera; an optical control plate, which controls the light ejecting from the backlight lamp, to emit the light in the linear array camera at high efficiency; a control part, which lighting up the backlight lamp after passing the setting time that the panel to be inspected enters in the visual field of the linear array camera.

Description

Technical field [0001] The invention relates to a non-lighting inspection device that illuminates an inspection light on a panel to be inspected to detect whether the panel to be inspected has defects such as dust and other foreign objects, bubbles and the like. Background technique [0002] Non-lighting inspection is an inspection that illuminates the display panel with the backlight to detect whether the display panel has foreign objects or defects. The aforementioned non-lighting inspection is generally known. For example, there is an example described in Patent Document 1. This non-lighting inspection is performed before the lighting inspection performed by bringing the probe into contact with the electrode of the display panel in which the liquid crystal is enclosed. The non-lighting inspection device is installed near a conveyor such as a production line to inspect the conveyed display panel at any time. Specifically, the display panel is sucked from the conveyor by a ro...

Claims

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Application Information

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IPC IPC(8): G01N21/88
CPCG01N21/8806G01N21/8851G02F1/1309G02F2203/69
Inventor 水野邦广
Owner NIHON MICRONICS
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