Method and device for reconfiguring scan chains in consideration of planning groups

A scan chain and planning group technology, applied in computing, computer-aided design, special data processing applications, etc., can solve the problem of too many ports on the planning group and inter-group connections, and achieve good planning and design results and reduce demand.

Active Publication Date: 2014-09-10
SYNOPSYS SHANGHAI
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  • Abstract
  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of this, the industry still needs a scan chain reconstruction technology solution to solve the problem of too many ports on the planning group and too many connections between groups

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  • Method and device for reconfiguring scan chains in consideration of planning groups
  • Method and device for reconfiguring scan chains in consideration of planning groups
  • Method and device for reconfiguring scan chains in consideration of planning groups

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Embodiment Construction

[0022] In order to better understand the spirit of the present invention, it will be further described below in conjunction with preferred embodiments of the present invention.

[0023] The invention proposes a scan chain reconfiguration method and device based on a planning group in the planning and design stage of a chip module.

[0024] According to an embodiment of the present invention, the scan chain reconstruction method based on plan groups includes two stages:

[0025] Firstly, in the first stage of scan chain reconfiguration, a scan chain selects scan elements from as few plan groups as possible based on the number of scan elements in the plan groups. And during the reconstruction process, the relationship between the start and end points of the scan chain and the planning group is fully considered, so that the scanning components in the same planning group will be assigned to the associated scan chains in priority, thereby reducing the possible connection between pl...

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Abstract

The present invention provides a scan chain reconfiguration method and device considering plan groups. The scan chain reconfiguration method includes a first-stage reconfiguration and a second-stage reconfiguration. The first-stage reconstruction first classifies several scan chains, among which the scan chains whose start and end points are in the same plan group are classified as the first set of scan chains; the scan chains whose start point and end point are not in the same plan group are classified as the second set A set of scan chains; scan chains whose start and end points are at the top level are classified as a third set of scan chains. Then, first reconstruct the scan chains in the first scan chain set, then reconstruct the scan chains in the second scan chain set, and finally reconstruct the scan chains in the third scan chain set. The scanning chain reconfiguration method and device of the present invention consider the position information of the start and end points of the scan chain from a global point of view, so as to make it pass through the planning group as little as possible. Therefore, the ports on the planning group and the connections between the planning groups are greatly reduced, and the demand for resources and the difficulty of subsequent design are reduced.

Description

technical field [0001] The invention relates to a scan chain reconfiguration method and device, in particular to a scan chain reconfiguration method and device in the planning and design stage of a chip module. Background technique [0002] When planning and designing a module for a chip including a test chain, the arbitrary distribution of scanning components will cause too many connections between various planning groups. At the same time, each planning group also needs to create more ports to undertake the input and output of scanning signals. This makes each planning group require a lot of resources when applied at the top level, thus increasing the difficulty of design. In order to reduce the number of ports on the plan group and the number of connections between the groups caused by the scan chain passing through the plan group, it is necessary to restructure the scan chain, that is, to adjust the positions of the scan components to form a new scan chain. [0003] f...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
CPCG06F2217/14G06F17/505G06F30/327G06F30/333
Inventor 葛坤峰刘榜
Owner SYNOPSYS SHANGHAI
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