Standard substance for calibrating magnification of industrial computed tomography (CT) system

An industrial computer and tomography technology, applied in the direction of using radiation for material analysis, etc., can solve the problems of no electrical conductivity, no fixed position length measurement characteristics, no visible magnification, etc.

Inactive Publication Date: 2013-05-29
SHANGHAI INST OF MEASUREMENT & TESTING TECH
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, manufacturers of industrial computed tomography systems use their own self-developed standard materials to calibrate the magnification, but these standard materials do not have fixed-position length measurement characteristics, nor do they have good conductivity, and there is no commercial application in the market Standard material for calibrating the magnification of industrial computed tomography systems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Standard substance for calibrating magnification of industrial computed tomography (CT) system
  • Standard substance for calibrating magnification of industrial computed tomography (CT) system
  • Standard substance for calibrating magnification of industrial computed tomography (CT) system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0013] Embodiment 1: refer to figure 1 , figure 2 , image 3 , Figure 4 , Figure 5 , Image 6 . The present invention needs to carry out value determination to the present invention before carrying out measurement standard value transfer, the value determination example of the present invention is as follows: put the certified standard substance of the present invention and the scanning electron microscope into the scanning electron microscope at the same time, the certified standard substance It was developed by Agar Science Company of the United Kingdom, and its traceability was determined by the National Physical Laboratory (NPL) of the United Kingdom. In this embodiment, the diameter of the through hole is selected as 0.2 mm or 0.5 mm. In the state of the low magnification and large field of view of the scanning electron microscope, the rotation function of the sample stage is used to place the connecting line direction between the center of the through hole and t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
pore sizeaaaaaaaaaa
pore sizeaaaaaaaaaa
Login to view more

Abstract

The invention relates to the technical field of the transmission of metering and testing standard quantity values, and particularly relates to a standard substance for calibrating magnification of an industrial CT system. The standard substance for calibrating magnification of an industrial CT system is characterized in that: a substrate of the standard substance is provided with a counter bore and a pilot hole; inside the counter bore is provided a sheet with a through hole, wherein the thickness of the sheet is 0.1 to 0.3 mm, the sheet is made of metal platinum alloy, and the aperture of the through hole is 0.2 to 0.5 mm. According to the invention, a scanning electron microscope with a certified standard substance is employed for measuring, so a certified standard substance for calibrating magnification of an industrial CT system is obtained, thereby solving the problem of lack of calibration in metering and testing magnification of the industrial CT system, providing a trace valueto the source for an image length value of the calibrated industrial CT system with uncertainty of a given confidence interval attached; therefore, a three-dimensional image of the calibrated industrial CT system has traceable length values.

Description

technical field [0001] The invention relates to the technical field of measurement and test standard value transfer, in particular to a standard substance used for calibrating the magnification of an industrial computer tomography system. Background technique [0002] The English name of the computerized tomography system developed in the 1980s is Computed Tomography (CT), which mainly uses the penetration of high-energy rays on objects to achieve non-destructive analysis of the internal structure of objects. The three-dimensional length value, density and other characteristics are detected. As the computerized tomography system (CT) is widely used gradually, the medical computerized tomography system (hereinafter referred to as medical CT) has been widely used in medical inspection. For the examiners of the medical CT system, due to the individual characteristics of human organs, they only need to observe qualitatively whether there are lesions in human organs, and do not ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/04
Inventor 姜志华盛克平
Owner SHANGHAI INST OF MEASUREMENT & TESTING TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap