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Method for eliminating imaging device process mismatch and imaging nonlinear influence

An imaging device and nonlinear technology, applied in the field of optical sensors, can solve problems such as inability to obtain optical data, distortion, and inability to control process mismatch to a small size

Active Publication Date: 2013-05-01
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] This traditional method of using soft programming technology to reduce the threshold distribution has strict requirements on the peripheral circuit, and it is often impossible to control the process mismatch within a small range in practice.
If the imaging units in different areas of the imaging device have a large process mismatch and are affected by the deviation of the reset threshold, even if they are exposed to the same optical signal, the final read data will be quite different, resulting in serious distortion and cannot be obtained. ideal optical data

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  • Method for eliminating imaging device process mismatch and imaging nonlinear influence
  • Method for eliminating imaging device process mismatch and imaging nonlinear influence
  • Method for eliminating imaging device process mismatch and imaging nonlinear influence

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Embodiment

[0033] like figure 2 As shown, 100 is an imaging device array with a size of p×q, and 101 is a pixel in the 100 imaging device array. Full chip erasing is first performed on the imaging units in the imaging device array. After the erasing operation, the threshold value of the imaging unit in the array is measured, and the threshold value of the imaging unit in the array will present a distribution, such as figure 1shown. In practice, the smaller the range of this distribution, the better the consistency of the array imaging units, and the smaller the final imaging distortion. The present invention does not aim at reducing this distribution range, but uses a differential technique to eliminate the influence of the initial threshold voltage distribution on imaging.

[0034] On the imaging device array, some reference units are set, and only reset operation, read operation and non-light imaging operation are performed on such units. The rest of the units are imaging units, ...

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Abstract

The invention discloses a method for eliminating imaging device process mismatch and imaging nonlinear influence, and the method comprises: configuring a reference unit and a plurality of imaging unit for each pixel in an imaging device array; setting up a matrix MA respectively with f (Vt) as a horizontal coordinate and g (h) as a vertical coordinate; erasing all the imaging units and the reference units in the actual imaging operation, carrying out a light imaging operation on the imaging unit of any pixel and a dark imaging operation on the reference unit of any pixel, and then surveying the f (Vt) and g (h) of each reference unit; and executing a table check program in the matrix MA, thus obtaining the actual value of light intensity. By utilizing the difference technology provided bythe invention, the influence of an initial different threshold voltage on the imaging array is eliminated, the image quality is improved, and simultaneously the influence brought by tunneling effect nonlinearity in the imaging process is eliminated.

Description

technical field [0001] The invention relates to the technical field of optical sensors, in particular to a method for eliminating the process mismatch of an imaging device and the non-linear influence of imaging. Background technique [0002] Imaging devices are currently one of the most widely used devices in the field of imaging. Imaging devices convert external optical signals into electrical signals, and then convert them into digital signals that can be processed by digital systems. It has a wide range of applications, whether in DC, DV or monitoring systems. The quality of imaging depends largely on the performance of the imaging device and the working mode and circuit performance of its peripheral circuits. [0003] Common imaging devices such as Figure 4 As shown, when imaging with an imaging device, the device is first reset to sweep the photoelectrons that may exist in the floating gate out of the floating gate. The traditional reset method is to use FN tunneling...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J1/42
Inventor 冀永辉王风虎刘明王琴龙世兵闫锋
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI