Method for eliminating imaging device process mismatch and imaging nonlinear influence
An imaging device and nonlinear technology, applied in the field of optical sensors, can solve problems such as inability to obtain optical data, distortion, and inability to control process mismatch to a small size
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0033] like figure 2 As shown, 100 is an imaging device array with a size of p×q, and 101 is a pixel in the 100 imaging device array. Full chip erasing is first performed on the imaging units in the imaging device array. After the erasing operation, the threshold value of the imaging unit in the array is measured, and the threshold value of the imaging unit in the array will present a distribution, such as figure 1shown. In practice, the smaller the range of this distribution, the better the consistency of the array imaging units, and the smaller the final imaging distortion. The present invention does not aim at reducing this distribution range, but uses a differential technique to eliminate the influence of the initial threshold voltage distribution on imaging.
[0034] On the imaging device array, some reference units are set, and only reset operation, read operation and non-light imaging operation are performed on such units. The rest of the units are imaging units, ...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 