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A testing method and device for error checking and correcting ability

A test method and technology of error correction ability, which are applied in the direction of error detection of redundant codes and generation of response errors, etc., can solve problems such as no test plan is given, and achieve the goal of improving security and stability and improving error correction ability. Effect

Active Publication Date: 2011-12-14
WUXI ZGMICRO ELECTRONICS CO LTD
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  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

Regarding the error correction capability of the ECC algorithm, there is a theoretically defined error correction value, but there is no specific test plan in the prior art for whether the ECC algorithm can achieve this theoretical error correction value

Method used

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  • A testing method and device for error checking and correcting ability
  • A testing method and device for error checking and correcting ability
  • A testing method and device for error checking and correcting ability

Examples

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Embodiment Construction

[0020] In the embodiment of the present invention, the error-corrected test data is corrected according to the ECC algorithm and the correct ECC data, and the error-corrected data is obtained; the correct ECC data is obtained based on the correct data; the test data with errors is Obtained after making errors on the correct data; comparing the corrected data with the correct data, you can know how many errors have been corrected by ECC, and thus know the error correction capability of the ECC algorithm.

[0021] In this embodiment, the erroneous test data includes erroneous original data obtained after making errors to correct original data and / or erroneous ECC data obtained after making errors to correct ECC data.

[0022] The original data in the embodiment of the present invention refers to the data obtained at first, no error is made, and it is correct data by default; ECC data refers to the data obtained after calculation according to data (such as original data, etc.) and...

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PUM

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Abstract

The invention discloses an error checking and correcting ability testing method which is used for testing the error correcting ability of an ECC (error correction code) algorithm so as to judge whether the ECC algorithm can better fulfill the error correcting task. The error checking and correcting ability testing method comprises the steps of: according to the ECC algorithm and correct ECC data, correcting the wrong tested data and obtaining the corrected data, wherein the correct ECC data is obtained according to correct data, and the wrong tested data is obtained after an error is made to the correct data; and comparing the corrected data with the correct data, and obtaining the error correcting ability of the ECC algorithm according to the result of comparison. The invention also discloses a device for realizing the method.

Description

technical field [0001] The invention relates to computer and embedded fields, in particular to a testing method and device for error checking and correcting capabilities. Background technique [0002] Nand-flash is a kind of flash memory, which uses a nonlinear macro-cell mode inside, which provides a cheap and effective solution for the realization of solid-state large-capacity memory. Nand-flash has the advantages of low cost, large capacity, and fast rewriting speed, and is suitable for storing large amounts of data, so it has been more and more widely recognized in the industry. As people continue to pursue products with lower power consumption, lighter weight and better performance, Nand-flash is more and more widely used in mobile multimedia devices to store applications or build file systems on it to store multimedia data. Such as digital cameras, MP3 (Moving Picture Experts Group Audio Layer III) walkmans, memory cards, etc. in embedded products. [0003] Due to th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/10
Inventor 凌明
Owner WUXI ZGMICRO ELECTRONICS CO LTD
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