Accuracy measurement method for star sensor

A technology of star sensor and precision measurement, which is applied in the direction of measuring devices and instruments, and can solve problems such as high price and complicated operation of test methods

Active Publication Date: 2011-12-21
北京天银星际科技有限责任公司
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Problems solved by technology

[0005] For this reason, the present invention needs to provide a kind of accuracy measurement method for star sensor, described accuracy measurement method can be realized easily, solves traditional test method complicated operation, needs the puzzlement of expensive precision turntable and star simulator, At the same time, the measurement results are more accurate and authentic than the rotary table measurement method, and the test accuracy can meet the requirements of the star sensor

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  • Accuracy measurement method for star sensor
  • Accuracy measurement method for star sensor
  • Accuracy measurement method for star sensor

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Embodiment Construction

[0054] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0055] In describing the present invention, it should be understood that the terms "center", "longitudinal", "transverse", "upper", "lower", "front", "rear", "left", "right", " The orientations or positional relationships indicated by "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. are based on the orientation or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying Describes, but does not indicate or imply that the device or element referred...

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Abstract

The invention discloses a precision measurement method for a star sensor, which comprises the following steps of: 1) fixing the star sensor on the earth; 2) inputting time T of measurement starting time relative to J2000.0 into the star sensor; 3) determining the direction vector of J2000.0 right angle coordinate system according to the declination and right ascension as well as apparent motion parameter (alpha', delta') of a navigator star under the J2000.0 coordinate system; 4) converting the direction vector of the navigation star under the J2000.0 right angle coordinate system into the direction vector under an epoch ecliptic coordinate system; 5) converting the direction vector under the epoch ecliptic coordinate system into the direction vector (v CRFT) under a spherical coordinate system; and 6) changing the direction vector of the navigation star under the spherical coordinate system into the direction vector (v TRF) under a fixed ground coordinate system, on the basis of the direction vector (v TRF) under the fixed ground coordinate system, obtaining the precision of the star sensor. According to the method disclosed by the invention, the precision measurement of the starsensor can be easily realized.

Description

technical field [0001] The invention belongs to the technical field of attitude sensors, in particular to an accuracy measurement method for a star sensor. Background technique [0002] With the advantages of high precision, low power consumption, and small size, star sensors have become the most competitive attitude-sensing devices for spacecraft. At present, the attitude determination accuracy of star sensors can reach 10″, and the accuracy of some types of star sensors can even reach 1″ level. High precision is the key factor for the rapid development and wide application of star sensors. With the increasing precision of star sensors, higher requirements are put forward for precision measurement methods. Traditional test methods are mainly based on star simulators and precision turntables. The position accuracy of turntables needs to be an order of magnitude higher than that of star sensors, that is, to reach the sub-arcsecond level. This kind of equipment is expensive a...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C25/00
Inventor 尤政邢飞孙婷张高飞李滨
Owner 北京天银星际科技有限责任公司
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