Seamless integration of process control devices in a process control environment

Abstract

The invention relates to a process control system and a diagnostic device and an interface device for the process control system. In order to facilitate seamless integration of process control devices in a process control system, an integrated seamless diagnostic device collects diagnostic data related to the operation of, or problems associated with, one communication link that supports one process control protocol but communicates the collected diagnostic data to other entities in the process control system via another communication link that supports a different process control protocol. As a result, problems with the communication link monitored by the integrated seamless diagnostic device can be reported to the appropriate entities in the process control system as they occur and without unwanted delay. Moreover, problems with the monitored communication link can be communicated to the appropriate entities via process control protocols that are understood by those entities (and other entities in the process control system) and without consuming the potentially valuable resources of the monitored communication link.

Description

technical field [0001] The present disclosure relates generally to process control systems, and more particularly to seamless integration of process control devices of various different protocol types in process control systems. Background technique [0002] Process control systems such as those used in chemical, petroleum, or other process plant environments typically include communicatively coupled to at least one host computer or operator workstation and to one or more One or more process controllers of process control and test equipment such as, for example, field devices. Typically, field devices, such as valves, valve positioners, switches, transmitters, and sensors (e.g., temperature, pressure, and flow rate sensors), are installed in a process plant environment and perform process control functions within the process, such as Open or close valves, measure process control parameters, increase or decrease flow rates, etc. Additional, intelligent field devices with co...

AI Technical Summary

Problems solved by technology

However, as will be described in more detail below, these commonly used diagnostic devices are difficult to integrate into process control systems and can consume valuable resources of the process control system, thereby affecting its proper operation

Consequently, these commonly diagnostic devices often negatively impact the performance of process control systems

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