Test prods for high frequency measurement
A high-frequency, planar structure technology, applied in the direction of measuring electricity, parts of electrical measuring instruments, measuring devices, etc.
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[0022] Figure 1 to Figure 4 A preferred embodiment of a test probe according to the present invention shown in , comprises: a housing 10; a coaxial cable side end 12 having a coaxial plug connector 14 for connection to a coaxial cable (not shown) a contact side end 16 for contacting a planar structure 38; and a coplanar conductor structure having an intermediate signal conductor 18 and two ground conductors 20 and disposed between the coaxial cable side end 12 and the contact side end 16 . A gap 22 is formed between the signal conductor 18 and the adjacent ground conductor 20 of the coplanar conductor structure. This gap 22 is formed over the entire length of the coplanar conductor structure 18, 20 so that a constant preset characteristic impedance is obtained.
[0023] In the central interval between the coaxial cable side end 12 and the contact side end 16, the coplanar conductor structure 18, 20 is formed by a dielectric 24, for example in the form of a quartz block ( ...
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