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Test prods for high frequency measurement

A high-frequency, planar structure technology, applied in the direction of measuring electricity, parts of electrical measuring instruments, measuring devices, etc.

Active Publication Date: 2014-05-07
ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO KG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The invention is based on the problem of further improving test probes of the aforementioned type with regard to their electrical properties

Method used

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  • Test prods for high frequency measurement
  • Test prods for high frequency measurement
  • Test prods for high frequency measurement

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] Figure 1 to Figure 4 A preferred embodiment of a test probe according to the present invention shown in , comprises: a housing 10; a coaxial cable side end 12 having a coaxial plug connector 14 for connection to a coaxial cable (not shown) a contact side end 16 for contacting a planar structure 38; and a coplanar conductor structure having an intermediate signal conductor 18 and two ground conductors 20 and disposed between the coaxial cable side end 12 and the contact side end 16 . A gap 22 is formed between the signal conductor 18 and the adjacent ground conductor 20 of the coplanar conductor structure. This gap 22 is formed over the entire length of the coplanar conductor structure 18, 20 so that a constant preset characteristic impedance is obtained.

[0023] In the central interval between the coaxial cable side end 12 and the contact side end 16, the coplanar conductor structure 18, 20 is formed by a dielectric 24, for example in the form of a quartz block ( ...

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PUM

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Abstract

A test prod for high-frequency measurement having a contact-side end for electrically contacting planar structures and a cable-side end, for connecting to a cable, wherein between the contact-side end and the cable-side end a coplanar conductor structure having at least two conductors is arranged, wherein on the coplanar conductor structure a dielectric is arranged over a predetermined section between the cable-side end and the contact-side end, wherein the test prod is between the dielectric and the contact-side end such that the conductors of the coplanar conductor structure are arranged freely in space and relative to the dielectric in a suspending manner, wherein on one side of the test prod facing towards the planar structure a shielding element is arranged extending into the area of the coplanar conductor structure.

Description

technical field [0001] The invention relates to a test probe for high-frequency measurements having a contact side end for electrical contact with a planar structure and a cable for connection to a cable, in particular a coaxial cable A side end, in particular a coaxial cable side end, wherein a coplanar conductor structure with at least two conductors, in particular three conductors, is arranged between the contact side end and the cable side end , the dielectric for supporting the coplanar conductor structure is configured on the coplanar conductor structure, and the dielectric is configured on one side or both sides in a predetermined interval between the cable side end and the contact side end wherein the test probe is designed such that, between the dielectric and the contact-side end, the conductors of the coplanar conductor structure are free in space and suspended relative to the supporting dielectric way to configure. Background technique [0002] Such a test prob...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/067
CPCG01R1/06772
Inventor 斯蒂芬·迪斯
Owner ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO KG