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Short-term life test data-based quick life evaluation method

A technology of life test and evaluation method, applied in the direction of single semiconductor device test, measurement device, instrument, etc., can solve the problems of high cost and long test period, and achieve the effect of saving time and cost

Active Publication Date: 2012-04-25
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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Problems solved by technology

[0007] Aiming at the shortcomings of high cost and long test period of the life evaluation method in the prior art, the purpose of the present invention is to provide a fast life evaluation method based on short-term life test data, which realizes the life evaluation of long-life devices quickly and economically

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Embodiment Construction

[0023] see figure 1 , the present invention is a kind of fast life evaluation method based on short-term life test data, comprises the following steps: Step 1, obtain test original data: select suitable stress condition, carry out life test, obtain life test data, reject abnormal point in the test data, Used to determine the mathematical model;

[0024] Step 2, establish a mathematical model: use the original data to determine the degradation curve of the test device monitoring parameters and time, and establish a mathematical model;

[0025] Step 3, linear regression analysis: linearly change the mathematical model and original test data, so that the monitoring parameters and time obey the linear relationship, as shown in formula (1).

[0026] y=ax+b (1)

[0027] Using sample (experimental data) statistics can determine a, b, then the linear regression equation is determined as (2).

[0028] y = a ^ x ...

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Abstract

The invention discloses a short-term life test data-based quick life evaluation method, which comprises the following steps of: (1) selecting proper stress to perform life test on a device to obtain original data; (2) establishing a mathematical model based on data obtained by the life test; (3) performing linear regression analysis on the life test data; (4) determining model parameters by using a least square method principle; (5) performing calculation of test of goodness of fit to judge validity of the model; (6) calculating significance test statistic, and determining whether a regression equation has significance under a given significance level condition; and (7) statistically analyzing a reliability quantitative index of the test device by using a weibull distribution function and the established mathematical model to obtain a life index and life distribution of the device.

Description

technical field [0001] The invention relates to a life evaluation method of components, in particular to a rapid life evaluation method based on short-term life test data. Background technique [0002] The development of modern science and technology and the improvement of industrial level have accelerated the improvement of materials, components and process quality and reliability, making the product life longer and longer. Since 1973, the average service life of foreign semiconductor devices has doubled every 15 months, and the loss time of electronic products has remained stable for a long time between 5-10 years from the 1950s to the 1980s, and has grown to 50 years of current solid-state electronic products. year. The service life of some key components of equipment developed in my country in the past 20 years has also been greatly improved. For example, the service life of the Stirling refrigerator for space has reached 10 years, and the service life of high-power sem...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R31/26
Inventor 路国光黄云杨少华雷志锋冯敬东
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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