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Level measuring equipment

A level measurement and plane technology, applied in the field of measurement, can solve problems affecting work efficiency, troublesome adjustment, time-consuming, etc., and achieve the effects of improving measurement accuracy, easy placement and installation, and high measurement accuracy

Active Publication Date: 2013-11-13
SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The accuracy that needs to be adjusted is different in different engineering practices. Normally, leveling instruments are used, including: bubble leveling instruments, electronic leveling instruments, and inductance leveling instruments. A common feature of these leveling instruments is that they can only be placed on the measured object , when the measured object is based on the lower surface, and the space for measuring the lower surface is relatively narrow, the leveling instrument mentioned above cannot be used directly
[0003] It is also possible to use the self-collimation collimator, and the principle of optical self-collimation can also be used to achieve horizontal measurement, but it takes time to adjust the optical path with this method, the adjustment is more troublesome, and affects work efficiency

Method used

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Embodiment Construction

[0025] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0026] see figure 1 and figure 2 . figure 1 and 2 Shown is the measurement principle structure diagram and optical path diagram of the level measuring device of the present invention. The light emitted by the light source 7 irradiates the first differentiation plate 6 engraved with reticle lines, and the reticle lines on the first differentiation plate 6 pass through the first lens group 5 to form parallel light, which is imaged at infinity. The parallel light passes through the beam splitting prism 3 and is divided into two beams: one beam of reference light and one beam of measuring light. Wherein the reference light directly passes through the second lens group 8 , and the cross image of the first differentiation plate 6 is imaged at the center of the second differentiation plate 9 . The measuring light passes through the beam-splitti...

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Abstract

The invention relates to level measuring equipment, which comprises: a measured plane; an optical autocollimating system for generating an autocollimating reference ray and a measuring ray; and a multiple reflection system used for reflecting the measuring ray for multiple stable times. The rays generated by a light source in the autocollimating system pass through a beam splitting prism so as to obtain a reference ray and a measuring ray, which is amplified by the multiple reflection system and then compared with the reference ray. The level measuring equipment of the invention is suitable for measuring the inclination angle of the lower surface of a measured object, can be used in a narrow and small space, and is also suitable for measuring the degree of parallelism between two planes horizontally disposed in a space. Meanwhile, the measuring accuracy of the multiple reflection system can be improved by changing the reflection time of the system without changing other optical paths. Besides, the level measuring equipment provided in the invention is easy to dispose and install, and has high measuring accuracy.

Description

technical field [0001] The present invention relates to the technical field of measurement, and in particular, the present invention relates to a level measuring device that uses an autocollimation system to measure a level. Background technique [0002] Level adjustment is a frequently encountered engineering step in engineering practice, especially in precision engineering practice. In different engineering practices, the accuracy of adjustment is different. Normally, leveling instruments are used, including: bubble leveling instruments, electronic leveling instruments, and inductance leveling instruments. A common feature of these leveling instruments is that they can only be placed on the measured object , when the measured object is based on the lower surface, and the space for measuring the lower surface is relatively narrow, the leveling instrument mentioned above cannot be used directly. [0003] It is also possible to use the self-collimating collimator, and the pr...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01C9/00G02B17/06G02B27/10
Inventor 贾翔杨晓青徐兵
Owner SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD
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