Solid-state imaging device and manufacturing method thereof, and electronic apparatus

A solid-state imaging device and solid-state imaging technology, which are used in electric solid-state devices, radiation control devices, televisions, etc., can solve the problems of impossible microfabrication, difficult to overlap the optical center Q of the viewing angle area, and difficult to focus, and reduce the number of lenses. Effect

Inactive Publication Date: 2012-05-30
SONY SEMICON SOLUTIONS CORP
View PDF5 Cites 29 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

That is, when the semiconductor chip 167 is bent one by one, microfabrication is impossible, and the center P of the viewing angle area and the optical center Q of the lens are difficult to coincide with each other
Therefore, it is difficult to focus uniformly across the entire viewing angle area

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Solid-state imaging device and manufacturing method thereof, and electronic apparatus
  • Solid-state imaging device and manufacturing method thereof, and electronic apparatus
  • Solid-state imaging device and manufacturing method thereof, and electronic apparatus

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0072] 1. First Embodiment (A structural example of a solid-state imaging device and an example of its manufacturing method)

[0073] 2. Second Embodiment (A structural example of a solid-state imaging device and an example of its manufacturing method)

no. 3 example

[0074] 3. Third Embodiment (A structural example of a solid-state imaging device and an example of its manufacturing method)

no. 4 example

[0075] 4. Fourth Embodiment (A structural example of a solid-state imaging device and an example of its manufacturing method)

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A solid-state imaging device (1) includes a supporting substrate (3) that includes a concave portion (2), a solid-state imaging chip (4) that is bonded on the supporting substrate (3) so as to seal the concave portion (2) in a view-angle region, a stress film (5) that is formed on the surface of the solid-state imaging chip (4), and an imaging surface curved toward the concave portion (2) at least in the view-angle region.

Description

[0001] Cross References to Related Applications [0002] The present application contains subject matter related to the disclosure of Japanese Priority Patent Application JP 2010-260973 filed in the Japan Patent Office on Nov. 24, 2010, the entire content of which is hereby incorporated by reference. technical field [0003] The present invention relates to a solid-state imaging device, a method of manufacturing the same, and an electronic device such as a camera including the solid-state imaging device. Background technique [0004] As a solid-state imaging device (imaging sensor), a CMOS solid-state imaging device, a CCD solid-state imaging device, and the like are known. Such as Figure 39 As shown, a camera 161 using a solid-state imaging device generally includes a solid-state imaging device 162 formed in a flat plate shape and an imaging lens system 164 composed of a plurality of lenses 163 . When an imaging lens system images an object, a focus position deviates betw...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01L27/146H04N5/374
CPCH01L27/1464H01L2924/0002H01L27/1469H01L27/14634H01L23/13H01L27/14618H01L2924/00
Inventor 糸长总一郎
Owner SONY SEMICON SOLUTIONS CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products