Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Low temperature environment testing apparatus

A test device and low-temperature environment technology, which is applied in the field of low-temperature performance test devices for electronic products, can solve the problems of poor low-temperature constant state, slow cooling speed, complex structure, etc., and achieve the effects of ensuring stability, improving stability, and being easy to use and operate

Inactive Publication Date: 2015-05-27
XIAN DAYU PHOTOELECTRIC TECH
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the low-temperature environmental test devices of many domestic enterprises have complex structures, slow cooling speed, poor low-temperature constant state, and high energy consumption.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Low temperature environment testing apparatus
  • Low temperature environment testing apparatus
  • Low temperature environment testing apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] Such as figure 1 , figure 2 and image 3 As shown, the present invention includes a low-temperature working chamber 9, a controller 12, a cold air intake window 7 installed on the left or right side wall of the low-temperature working chamber 9, and a cold air inlet window 7 installed on the right or left side wall of the low-temperature working chamber 9. The upper air return window 8, the cold air circulation channel arranged outside the low-temperature working chamber 9 and continuously inputting cold air into the low-temperature working chamber 9, and the temperature detection device for real-time detection of the internal temperature of the low-temperature working chamber 9. The cold air circulation channel includes a cold air intake channel 6 and an air return channel 10, the upper ends of the cold air intake channel 6 and the air return channel 10 are connected, and the joints of the two are arranged with the compressor unit 1. The low-temperature exchanger 4 ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a low temperature environment testing apparatus. The apparatus comprises a low temperature working bin, a controller, a cold air intake window, an airflow returning window, a cold air circulation channel and temperature-detecting devices; the cold air circulation channel comprises a cold airflow intake channel and an airflow returning channel, a low temperature exchanger is arranged at a position where the cold airflow intake channel and the airflow returning channel joint, a fan set is installed on the cold airflow intake channel or on the airflow returning channel, and the fan set continuously sends cold airflow obtained after the low temperature exchanger carries out low temperature exchange to the low temperature working bin through the cold airflow intake channel and synchronously continuously pumps air in the low temperature working bin to the position where the low temperature exchanger is installed through the airflow returning channel for low temperature exchange, thereby realizing continuous circular flowing of air in the cold air circulation channel. The low temperature environment testing apparatus provided in the invention has the advantages of a simple structure, compact installation, convenient arrangement, simple usage and operation, a good application effect, a fast cooling speed, a good constant temperature effect and low energy consumption and can effectively overcome a plurality of practical problems of conventional low temperature environment testing apparatuses.

Description

technical field [0001] The invention relates to a low-temperature performance test device for electronic products, in particular to a low-temperature environment test device. Background technique [0002] The rapid cooling environment test of electronic products is a necessary means to eliminate early failure of electronic products and control product quality. The cooling speed of the test environment and the constant state of the low temperature are important technical indicators of the test conditions, and they will directly affect the test results of electronic products. At present, the low-temperature environmental test devices of many domestic enterprises have complex structures, slow cooling speed, poor low-temperature constant state, and high energy consumption. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a low-temperature environment test device for the deficiencies in the above-mentioned prior art, ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N17/00
Inventor 李美川张超
Owner XIAN DAYU PHOTOELECTRIC TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com