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Testing method for RAID (redundant array of independent disk) cards

A testing method, a stress testing technique, applied in the server field

Active Publication Date: 2014-08-13
曙光信息系统(辽宁)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the defect that the prior art cannot test the stability of the RAID card in the RAID array in the degraded (Degraded) state and the rebuilding (Rebuilding) state, and cannot automatically perform multiple startup and shutdown tests, the present invention provides a RAID card The test method solves the technical problem of how to test the stability of the RAID card in the RAID array in the degraded (Degraded) state and rebuilding (Rebuilding) state, and also solves the technical problem of how to automatically perform multiple startup and shutdown tests

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  • Testing method for RAID (redundant array of independent disk) cards
  • Testing method for RAID (redundant array of independent disk) cards
  • Testing method for RAID (redundant array of independent disk) cards

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Embodiment Construction

[0023] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0024] figure 1 A testing method of a RAID card according to an exemplary embodiment of the present invention is shown. exist figure 1 middle:

[0025] Step S100: Connect the RAID card with multiple hard disks to form a RAID array. Wherein, the RAID array may be a RAID5 array.

[0026] Step S102: Remove at least one hard disk in the RAID array, and use the first hard disk stress test tool to perform a stress test on the RAID array. This step simulates the situation that a hard disk in the user's RAID array is damaged. After at least one hard disk is removed from the RAID array, the RAID array will be in a degraded state. At this time, use a hard disk stress tes...

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Abstract

The invention provides a testing method for RAID (redundant array of independent disk) cards, which includes: step S1, connecting an RAID card with a plurality of hard disks to form an RAID array; and step S2, removing at least one hard disk from the RAID array, and using a first hard disk pressure testing tool to test pressure of the RAID array. The testing method for RAID cards can be used for completely and accurately testing stability of the RAID cards, and is timesaving and laborsaving.

Description

technical field [0001] The present invention basically relates to the server field, and more specifically, relates to a testing method for a RAID card. Background technique [0002] As a key component in the server, a RAID (Redundant Array of Independent Disk, Redundant Array of Independent Disk) card can effectively protect user data security. But if the RAID card itself cannot work stably, data security will be out of the question. At present, the testing of RAID cards in the industry puts more emphasis on performance, and the testing of stability is mostly limited to long-term stress testing. [0003] A kind of method for testing RAID card compatibility and stability is provided in the prior art, it is characterized in that test procedure is as follows: 1) whether the RAID card structure test test RAID card and chassis, mainboard, cable coordinate on installation structure No looseness, including drop and vibration testing; 2) RAID card basic function test: (1) power-on...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
Inventor 李景运
Owner 曙光信息系统(辽宁)有限公司