Electric stress limit evaluation method for gallium arsenide monolithic microwave power amplifier
A gallium arsenide and electrical stress technology, which is applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., can solve problems such as instantaneous high energy or overelectric stress, and stress limit evaluation of microwave power discharges without gallium arsenide monolithic chips, etc., to achieve Effects of Improving Device Design
Inactive Publication Date: 2014-08-06
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology
However, in the use of devices, this kind of high temperature is most likely caused by the transient high energy or overelectric stress generated by electrostatic discharge. A series of transient effects induced by working under high field strength have great influence on the improvement of microwave device performance and device reliability. sex presents a challenge
At present, there is indeed no electrical stress limit evaluation method for GaAs monolithic microwave power amplifiers.
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[0064] The present invention will be further elaborated below in conjunction with the accompanying drawings.
[0065] The concepts involved in this patent document are now explained to facilitate the understanding of this article.
[0066] In this paper, the main purpose of limit evaluation is to detect and obtain the stress limit value (referred to as limit) that components and parts can withstand under the action of electrical stress, and evaluate the rationality of the limit. Due to the selectivity of the judging criteria and the gradient difference in the performance of components under stress, the "limit" in the limit evaluation can also be divided carefully, which is convenient for research.
[0067] 1. The concept of limit
[0068] The limit in this article refers to the critical stress value of the components that meet the specified requirements under the stress conditions of the specified time, including four limits: specification limit, inherent limit, usable limit ...
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A method for evaluating the electrical stress limit of a gallium arsenide monolithic microwave power amplifier, comprising the following steps: analyzing the gallium arsenide monolithic microwave power amplifier to obtain electrical parameters that have a large influence factor on device reliability; evaluating the electrical stress test according to the limit The parameter design method examines the electrical stress limit capability of the device, and gives the criterion according to the evaluation standard. The beneficial effect of the invention is that: the limit evaluation experiment is carried out in a voltage step mode, and the obtained limit capability of the device is closer to the real value. By analyzing the experimental data, the reliability margin of the device can be obtained, which provides a basis for the correct use of the device. The performance of the components under the specified optimal working conditions can be inspected to verify the real performance of the device. Effective failure modes of components can be exposed to improve device design.
Description
technical field [0001] The invention relates to a method for evaluating the electrical stress of components, in particular to a method for evaluating the electrical stress limit of a gallium arsenide monolithic microwave power amplifier. Background technique [0002] With the rapid development of my country's aerospace technology industry and the implementation of a series of major national projects, there are higher requirements for the performance, function and reliability of supporting components. At the same time, the design thinking of component manufacturers is also changing, from "simply meeting the contract requirements" to "enlarging the reliability margin of the product as much as possible to ensure that there will be no failures during use". Therefore, in order to achieve higher reliability requirements for aerospace components, it is necessary to understand the range or limit of the components to withstand stress, etc., and to grasp the margin between the actual ...
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IPC IPC(8): G01R31/00
Inventor 董宇亮付琬月姜宝钧徐军王茂琰毋俊玱何俊伟其他发明人请求不公开姓名
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA