The application relates to the technical field of photoelectric detection, and discloses a
solar cell photoelectric characteristic loss efficiency detection method and device based on
semiconductor multi-junction spectral characteristics, wherein the method is based on the
spectral response range of a sub-
cell layer of a multi-junction
solar cell, and a corresponding excitation
light source and a light filtering device are matched. Different
laser light sources with different wavelengths are used to excite different sub-
cell layers and capture
photoluminescence images, the characteristic differences of the multi-junction
solar cell before and after
irradiation damage are compared, the light-emitting characteristic
failure rate and the
photoelectric conversion efficiency
loss rate of each sub-
cell are calculated, and finally the
irradiation damage and efficiency loss results of the
irradiation-damaged multi-junction solar cell and each sub-cell are obtained. The application realizes nondestructive and non-contact layered detection of the multi-junction solar cell, the detection result can be quantified, the detection device structure is simple and easy to realize in
engineering, and the application is especially suitable for irradiation
damage detection and efficiency evaluation of a three-junction
gallium arsenide solar cell in the field of
spaceflight.