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Measuring method and device of sine wave local distortion

A measurement method, sine wave technology, which is applied in the field of measurement of sine wave local distortion, can solve problems such as the inability to give clear technical reference and technical guidance basis, and the inability to clearly give the distribution of distortion at the waveform.

Active Publication Date: 2014-06-18
BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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  • Application Information

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Problems solved by technology

However, if you want to control and reduce distortion from the aspects of time-domain physical mechanism and electromechanical structure, this method cannot give a clear technical reference and technical guidance basis
[0005] The current distortion measurement methods and technologies are completely implemented according to the definition. The distortion measurement results given are the average effect of the distortion in the sinusoidal waveform cycle, rather than the maximum value, and for each part of the sinusoidal waveform cycle. Distortion distribution cannot be given clearly

Method used

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  • Measuring method and device of sine wave local distortion
  • Measuring method and device of sine wave local distortion
  • Measuring method and device of sine wave local distortion

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Embodiment

[0042] A measuring device for sine wave local distortion, used for the measurement of sine wave time domain waveform signal or sine wave spatial distribution waveform signal, such as figure 1 As shown, including sensors, signal conditioning circuits, analog-to-digital conversion circuits, data registers, logic control circuits, interface circuits, computers, input and output circuits and clock circuits;

[0043] The sinusoidal waveform signal to be tested is converted into an electrical signal waveform after passing through the sensor, and then sent to the signal conditioning circuit for filtering and amplification, and then output to the analog-to-digital conversion circuit for sampling and conversion into a digital waveform sequence, and the waveform sequence is sent to the data register For registering, the computer reads the data in the data register through the interface circuit and stores, processes and displays information, and realizes human-computer interaction with th...

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Abstract

The invention relates to a measuring method and device of sine wave local distortion and belongs to the technical field of signal measurement and data processing. A measuring method of local common module distortion, local difference module distortion and local total distortion is provided through subdividing the sine wave local distortion, and a local phase change characteristic of the sine wave local distortion can be deeply disclosed. According to the invention, distortion distribution conditions in an actual sine-wave-shaped time domain or phase spatial domain can be obtained by calculating and analyzing through a virtual instrument manner, and time domain or phase space positioning can be carried out on a distortion maximum value point, so as to deeply disclose the phase change characteristic of the sine wave local distortion.

Description

technical field [0001] The invention relates to a method and device for measuring sine wave local distortion, belonging to the technical field of signal measurement and data processing. Background technique [0002] In waveform measurement, distortion is an important waveform quality index, which is used to quantitatively measure and express the difference between the actual waveform and its ideal model, and quantitatively give the waveform distortion value by the ratio of the difference value to the waveform amplitude. Intuitively, in the expression of time-varying waveform, distortion is a time-domain parameter, while in the expression of space shape, distortion becomes a space parameter. Theoretically, every waveform with a definite model has its own distortion, but in practice, due to problems in definition, measurement implementation, etc., only the sine waveform clearly gives the distortion index and forms a consensus. [0003] The current definition of sinusoidal wav...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R23/16G01R23/20
Inventor 梁志国朱振宇张大鹏武腾飞
Owner BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA