Detecting device and detecting method for thickness uniformity of silicon steel in width direction

Abstract

The invention discloses a detecting device for thickness uniformity of silicon steel in the width direction. The detecting device comprises a control panel, a measuring device, a measuring frame and a rail, wherein the control panel is connected with the measuring device and the measuring frame, the measuring device is arranged on the measuring frame which is connected with the rail, the measuring frame is operated in a direction in conformity with the width direction of the silicon steel, and the measuring frame is C-shaped. The detecting device in the technical scheme can measure intra-plate gauge deviation of thicknesses of steel belts one by one in real time instead of a manual mode, thickness measurement precision of the detecting device is higher than that of the manual mode, data are inquired conveniently and rapidly, an automatic alarm function is realized when the intra-plate gauge deviation of steel coils do not meet requirements and troublesome manual labor is greatly reduced.

Description

technical field [0001] The invention belongs to the technical field of manufacturing auxiliary detection equipment used in the steel manufacturing process, and in particular relates to a silicon steel thickness uniformity detection device in the width direction and a detection method thereof. Background technique [0002] In the field of steel manufacturing technology, auxiliary testing equipment is often needed to detect the thickness uniformity of silicon steel, that is, to detect the same-plate difference of silicon steel. The so-called "difference on the same plate" refers to the deviation of the thickness on a steel plate, and refers to the maximum value of the thickness difference between any two points on the same steel plate. In the actual steel processing and manufacturing process, there are strict requirements on the thickness of the silicon steel strip in the production process. The thickness is controlled according to the thickness fluctuation at its center point...

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Problems solved by technology

[0006] The technical problem to be solved by the present invention is that in the prior art, there is a lack of special equipment for the detection of the thickness of silicon steel. At present, the difference between the same plate of silicon steel is measured by manual use of high-precision micrometers, resulting in large fluctuations in thickness results, resulting in The measurement results are inaccurate, which has a serious impact on the analysis of the same plate difference; at the same time, manual measurement is far behind the production rhythm, and it is impossible to conduct online detection of silicon steel in the production process, and it is impossible to achieve real-time detection of abnormal steel coils. monitoring, leading to the emergence of unqualified products with the same plate difference, resulting in a decline in product quality, bringing great difficulties to users and other technical problems, and providing a silicon steel thickness uniformity detection device in the width direction and its detection method

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