Testing and sorting device for vertical light emitting diode

Abstract

A testing and sorting device for a vertical light emitting diode relates to the field of photoelectric technology. The device of the present invention includes a disc to be tested, a test disc, a sorting disc and a testing system. The structure of the device is characterized in that the disc to be tested, the test disc and the sorting disc are all discs capable of rotating, moving horizontally and vertically. The disc to be tested arranged at one side of the test disc is provided with a chip, and the sorting disc is placed at the other side of the test disc. An upper surface of the test disc is provided with a plurality of placing grooves in a circle, and each placing groove bottom is connected to a vacuum tube. A probe and a needle are arranged at a position corresponding to a placing groove at a test position and above the test disc, and the probe and the needle are respectively connected with the testing system. A test suction nozzle capable of rotating transposition is arranged between the disc to be tested and the test disc, and a sorting suction nozzle capable of rotating transposition is arranged between the sorting disc and the test disc. The device of the invention can automatically realize testing and sorting operation on a vertical LED chip, and has the advantages of simple operation and high efficiency.

Description

technical field [0001] The invention relates to the field of photoelectric technology, in particular to a testing and sorting device for vertical light-emitting diodes. Background technique [0002] The green and environment-friendly LED light source is to be used in the lighting field, and high power and high efficiency are the key elements for its popularization. The LED chip of the traditional structure, also known as the positive structure LED, has two electrodes on the same side. Another LED chip with a vertical structure has its upper and lower electrodes distributed on both sides of the epitaxial wafer. [0003] Most of the testing and sorting equipment for LED chips in the prior art is aimed at the formal structure. The general method is to adhere the sapphire side of the formal structure LED chip that is cut and cracked into a single core particle to the blue film, and use two probes to pierce the two electrodes on the same side to measure its photoelectricit...

AI Technical Summary

Problems solved by technology

Because the electrodes of the LED chip with vertical structure are located on both sides of the chip, it is not feasible to use the traditional method of testing on the blue film, because the blue film is an insulator, and the lower electrode attached to the blue film cannot be connected to the test power supply.

However, the testing and sorting equipment dedicated to the assembly line operation of vertical structure LED chips has not been publicly reported at home and abroad.

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